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參數(shù)資料
| 型號： | TLC5617AIDR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | DAC |
| 英文描述： | SERIAL INPUT LOADING, 12.5 us SETTLING TIME, 10-BIT DAC, PDSO8 |
| 封裝： | PLASTIC, SO-8 |
| 文件頁數(shù)： | 16/21頁 |
| 文件大?。?/td> | 307K |
| 代理商： | TLC5617AIDR |
TLC5617, TLC5617A
PROGRAMMABLE DUAL 10-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS151B – JULY 1997 – REVISED MARCH 2000
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range, VDD = 5 V ± 5%,
Vref (REFIN)= 2.048 V (unless otherwise noted)
static DAC specifications
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
10
bits
Integral nonlinearity (INL), end point adjusted
Vref(REFIN) = 2.048 V,
See Note 1
±1
LSB
Differential nonlinearity (DNL)
Vref(REFIN) = 2.048 V,
See Note 2
±0.1
± 0.5
LSB
EZS
Zero-scale error (offset error at zero scale)
Vref(REFIN) = 2.048 V,
See Note 3
±3
LSB
Zero-scale-error temperature coefficient
Vref(REFIN) = 2.048 V,
See Note 4
3
ppm/
°C
EG
Gain error
Vref(REFIN) = 2.048 V,
See Note 5
±3
LSB
Gain error temperature coefficient
Vref(REFIN) = 2.048 V,
See Note 6
1
ppm/
°C
Zero scale
Slow
80
PSRR
Power-supply rejection ratio
Gain
See Notes 7 and 8
Slow
80
dB
PSRR
Power-su
ly rejection ratio
Zero scale
See Notes 7 and 8
Fast
80
dB
Gain
Fast
80
NOTES:
1. The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error, is the maximum deviation of the output
from the line between zero and full scale excluding the effects of zero code and full-scale errors.
2. The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measured and ideal
1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains
constant) as a change in the digital input code.
3. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
4. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (Tmax) – EZS (Tmin)]/Vref × 106/(Tmax – Tmin).
5. Gain error is the deviation from the ideal output (Vref – 1 LSB) with an output load of 10 k excluding the effects of the zero-error.
6. Gain temperature coefficient is given by: EG TC = [EG(Tmax) – EG (Tmin)]/Vref × 106/(Tmax – Tmin).
7. Zero-scale-error rejection ratio (EZS-RR) is measured by varying the VDD from 4.5 V to 5.5 V dc and measuring the proportion of
this signal imposed on the zero-code output voltage.
8. Gain-error rejection ratio (EG-RR) is measured by varying the VDD from 4.5 V to 5.5 V dc and measuring the proportion of this signal
imposed on the full-scale output voltage after subtracting the zero scale change.
OUT A and OUT B output specifications
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VO
Voltage output
RL = 10 k
0
VDD –0.4
V
Output load regulation accuracy
VO(OUT) = 2V,
RL from 10 k to 2 k
0.5
LSB
IOSC
Output short circuit current
VO(OUT A) or VO(OUT B) to VDD or AGND
20
mA
IO(sink)
Output sink current
VO(OUT) > 0.25 V
5
mA
IO(source)
Output source current
VO(OUT) < 4.75 V
5
mA
reference input (REFIN)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VI
Input voltage
0
VDD –2
V
Ri
Input resistance
10
M
Ci
Input capacitance
5
pF
Reference feedthrough
REFIN = 1 Vpp at 1 kHz + 1.024 V dc (see Note 9)
–80
dB
Reference input bandwidth (f–3dB)
REFIN = 0 2 Vpp +1 024Vdc
Slow
0.5
MHz
Reference in ut bandwidth (f–3dB)
REFIN = 0.2 Vpp + 1.024 V dc
Fast
1
MHz
NOTE 9: Reference feedthrough is measured at the DAC output with an input code = 00 hex and a Vref(REFIN) input = 1.024 V dc + 1 Vpp
at 1 kHz.
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