參數(shù)資料
型號: TPS2070DAPR
廠商: Texas Instruments, Inc.
英文描述: FOUR-PORT USB HUB POWER CONTROLLERS
中文描述: 4端口USB集線器電源控制器
文件頁數(shù): 6/29頁
文件大?。?/td> 472K
代理商: TPS2070DAPR
TPS2070, TPS2071
FOUR-PORT USB HUB POWER CONTROLLERS
SLVS287A
SEPTEMBER 2000
REVISED FEBRUARY 2001
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
DISSIPATION RATING TABLE
PACKAGE
TA
25
°
C
POWER RATING
DERATING FACTOR
ABOVE TA = 25
°
C
11.6 mW/
°
C
42.5 mW/
°
C
TA = 70
°
C
POWER RATING
TA = 85
°
C
POWER RATING
32-DAP
32-DAP
Using PowerPAD as heatsink.
1162.8 mW
639.5 mW
465.1 mW
4255.3 mW
2340.4 mW
1702.1 mW
recommended operating conditions
MIN
4.5
MAX
5.5
UNIT
VI(BP)
VI(SP)
VI(VEXT)
VI(BP_DIS)
VI(ENx)
VI(EN_REG)
BP to OUTx (per switch)
SP to OUTx (per switch)
0
5.5
Input voltage
0
9
V
0
5.5
0
5.5
0
5.5
100
500
Continuous output current, IO
mA
BP to 3.3V_OUT
100
Operating virtual junction temperature, TJ
-40
125
°
C
electrical characteristics over recommended operating junction temperature range,
4.5 V
V
I(BP)
5.5 V, 4.85 V
V
I(SP)
5.5 V, 6 V
V
I(VEXT)
9 V, ENx = 0 V, EN_REG = 0 V,
BP_DIS = 0 V (unless otherwise noted)
input current
PARAMETER
TEST CONDITIONS
MIN
TYP
185
MAX
240
UNIT
Input current at BP, switches
disabled
t t BP
it h
N l
No load on OUTx and 3.3V_OUT,
ENx = VI(BP)
d 3 3V OUT
VI(SP) = Hi-Z
VI(SP) = 0 V
VI(SP) = 5 V
VI(SP) = Hi-Z
VI(SP) = 0 V
VI(SP) = 5 V
VI(BP) = Hi-Z
VI(BP) = 0 V
VI(BP) = 5 V
VI(BP) = Hi-Z
VI(BP) = 0 V
VI(BP) = 5 V
185
240
μ
A
II(BP)
175
210
Input current at BP, switches
enabled
t t BP
it h
N l
No load on OUTx and 3.3V_OUT,
ENx = 0 V
d 3 3V OUT
185
240
185
240
μ
A
175
210
Input current at SP, switches
disabled
t t SP
it h
N l
No load on OUTx and 3.3V_OUT,
ENx = VI(SP)
d 3 3V OUT
90
115
90
115
μ
A
II(SP)
115
140
Input current at SP, switches
enabled
t t SP
it h
N l
No load on OUTx and 3.3V_OUT,
ENx = 0V
d 3 3V OUT
90
115
90
115
μ
A
115
140
II(VEXT)
Input current at VEXT, LDO
controller disabled
VI(EN_REG) = 0 V or Hi-Z,
VI(BP) = 5 V,
VI(EN_REG) = 5 V,
VI(BP) = 5 V,
VI(SP) = Hi-Z
200
360
μ
A
Input current, at VEXT, LDO
controller enabled
VI(SP) = Hi-Z
10
mA
Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account separately.
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