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TQ2059
3
S
P
For additional information and latest specifications, see our website:
www.triquint.com
Absolute Maximum Ratings
Storage Temperature
Ambient temperature with power applied
Supply voltage to ground potential
DC input voltage
DC input current
Package thermal resistance (MQuad)
Die junction temperature
–65
°
C to +150
°
C
–55
°
C to +110
°
C
–0.5 V to +7.0 V
–0.5 V to (V
DD
+ 0.5) V
–30 mA to +5 mA
θ
JA
= 45
°
C/W
T
J
= 150
°
C
Note:
Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device.
The device should be operated only under the DC and AC conditions shown below.
Limits
1
Typ
Symbol
Description
Test Conditions
Min
Max
Unit
V
OH
V
OL
V
CMO
Output HIGH voltage
Output LOW voltage
Output common
mode voltage
Output differential voltage
Input HIGH level
V
CC
= Min PECL load
V
CC
= Min PECL load
PECL
V
CC
–1.20
V
CC
–2.00
V
CC
–1.60
V
CC
–0.50
V
CC
–1.60
V
CC
–1.20
V
V
V
V
OUT
V
IH2
PECL
Guaranteed input logical
HIGH Voltage for all inputs
Guaranteed input logical
LOW Voltage for all inputs
V
DD
= Max
V
DD
= Max
V
DD
= Max
V
DD
= Max
V
DD
= Min
0.6
2.0
1.2
V
V
V
IL2
Input LOW level
0.8
V
I
IL
I
IH
I
I
I
DDS3
V
I
Input LOW current
Input HIGH current
Input HIGH current
Power supply current
Input clamp voltage
V
IN
= 0.40 V
V
IN
= 2.7 V
V
IN
= 5.3 V
–150
0
2
85
–0.70
–400
25
1000
120
–1.2
μ
A
μ
A
μ
A
mA
V
I
IN
= –18 mA
DC Characteristics (V
DD
= +5 V + 5%, T
A
= 0
°
C to +70
°
C)
1
Symbol
Description
Test Conditions
Min
Typ
Max
Unit
C
IN
C
OUT
Input Capacitance
Output Capacitance
V
IN
= 2.0 V at f = 1 MHz
V
OUT
= 2.0 V at f = 1 MHz
6
9
pF
pF
Capacitance
Notes: 1. Typical limits are at V
DD
= 5.0 V and T
A
= 25C.
2. These are absolute values with respect to device ground and include all overshoots due to system or tester noise.
3. This parameter is measured with device not switching and unloaded.