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參數(shù)資料
| 型號(hào)： | TSM115CN |
| 廠商： | 意法半導(dǎo)體 |
| 英文描述： | 3.3V +5V 【12V Housekeeping IC |
| 中文描述： | 3.3 5V的【12V的管家集成電路 |
| 文件頁(yè)數(shù)： | 4/17頁(yè) |
| 文件大?。?/td> | 219K |
| 代理商： | TSM115CN |
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TSM115
Electrical Characteristics
4/17
Rem
THrm
TLrm
High threshold
Low threshold
From Low to high
From high to low
1.87
1.0
1.93
1.25
1.99
1.4
V
V
Power Good (PG)
Ipgol
Vpgol
Tpgr
Sink current
Low output voltage
Rise time PG
VPg=0.4V
Ipg=10mA
Rpg=1K
10
mA
V
ns
0.4
500
Under Voltage Blanking (Tuv) and Power Good (Tpg) times
Iotuvtpg
THtuv
TLtuv
THtpg
TLtpg
Idtuvtpg
Vtuvtpgol
Vtuvtpgoh
VinTuvTpg Input voltage
DIotuvtpg
Current source drift in temperature
Current output source
High threshold blanking
Low threshold blanking
High threshold power good
Low threshold power good
Current discharge of TuvTpg
Low output voltage
Clamp voltage
Vtuvtpg = 0V
From low to high voltage
From high to low voltage
From low to high voltage
From high to low voltage
4.5
0.287
5
5.5
0.337
μA
V
V
V
V
mA
V
V
V
μA
0.312
0.25
1.25
1
5
1.218
0.9
2
1.282
1.1
Iotutpg = 1mA
0.2
2.5
2.3
1
2.1
-0.3
2.3
Tmin < Tamb < Tmax
Remote (Trem) and Surge current blanking (Tsur) times
Iotrm
Iotsur
THtrm
TLtrm
Idtrmtsur
Vtrmtsurol Low output voltage
Vtrmtsuroh Clamp voltage
Vintrmtsur Input voltage
DIotrm
Current source drift in temperature
DIotsur
Current source drift in temperature
TRem current source
Tsur current source
High thresold voltage TRem
Low thresold voltage TRem
Current discharge of TRemTsur
Vtrmtsur = 0V
Vtrmtsur = 0V
From low to high
From high to low
90
9
100
10
1.25
1
5
110
11
1.282
1.1
μA
μA
V
V
mA
V
V
V
μA
nA
1.218
0.9
2
Iotmtsur = 1mA
0.2
2.5
2.3
5
500
2.1
-0.3
2.3
Tmin < Tamb < Tmax
Tmin < Tamb < Tmax
Fault
Ifltol
Vfltol
THVcc
TLVcc
HystVcc
IFault sink current
Low output voltage
High threshold voltage, Vcc low to high
Low threshold voltage, Vcc high to low
Vcc hysteresis : THVcc-TLVcc
VFault=0.4V
IFault=10mA
Rem low, all lines between
UV and OV.
10
mA
V
V
V
mV
0.4
2.95
2.65
TBD
TBD
300
Rcrnt
VRcrn
Output voltage
1.20
1.25
1.30
V
Symbol
Parameter
Test Condition
Min
Typ
Max
Unit
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