10
FN8159.4
September 15, 2006
D.C. Operating Characteristics Over the recommended operating conditions unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP.
MAX.
UNITS
ICC1
VCC supply current
(active)
fSCK = 2.5 MHz, SO = Open, VCC = 5.5V
Other Inputs = VSS
400
A
ICC2
VCC supply current
(nonvolatile write)
fSCK = 2.5MHz, SO = Open, VCC = 5.5V
Other Inputs = VSS
15
mA
ISB
VCC current (standby)
SCK = SI = VSS, Addr. = VSS,
CS = VCC = 5.5V
3
A
ILI
Input leakage current
VIN = VSS to VCC
10
A
ILO
Output leakage current
VOUT = VSS to VCC
10
A
VIH
Input HIGH voltage
VCC x 0.7
VCC + 1
V
VIL
Input LOW voltage
-1
VCC x 0.3
V
VOL
Output LOW voltage
IOL = 3mA
0.4
V
VOL
Output LOW voltage
IOH = -1mA, VCC ≥ +3V
VCC - 0.8
V
VOL
Output LOW voltage
IOH = -0.4mA, VCC ≤ +3V
VCC - 0.4
V
Endurance And Data Retention
PARAMETER
MIN
UNITS
Minimum Endurance
100,000
Data changes per bit per register
Data Retention
100
years
Capacitance
SYMBOL
TEST
TEST CONDITIONS
MAX
UNITS
CIN/OUT (Note 6) Input/Output capacitance (SI) VOUT = 0V
8
pF
Output capacitance (SO)
VOUT = 0V
8
pF
Input capacitance (A0, CS, WP, HOLD, and SCK)
VIN = 0V
6
pF
Power-Up Timing
SYMBOL
PARAMETER
MIN
MAX
UNITS
VCC power-up rate
0.2
50
V/ms
Power-up to initiation of read operation
1
ms
Power-up to initiation of write operation
50
ms
NOTES:
6. This parameter is not 100% tested.
7. tPUR and tPUW are the delays required from the time the (last) power supply (VCC-) is stable until the specific instruction can be issued. These
parameters are not 100% tested.
A.C. Test Conditions
Input pulse levels
VCC x 0.1 to VCC x 0.9
Input rise and fall times
10ns
Input and output timing level
VCC x 0.5
X9111