參數(shù)資料
型號: x9440
元件分類: 數(shù)字電位計
英文描述: Dual Digitally-Controlled (EEPOT) Potentiometer & Voltage Comparator(雙數(shù)控電位器和電壓比較器)
中文描述: 雙數(shù)字控制(EEPOT)電位
文件頁數(shù): 12/22頁
文件大?。?/td> 146K
代理商: X9440
X9440
Characteristics subject to change without notice.
12 of 22
REV 1.0 2/27/01
www.xicor.com
D.C. OPERATING CHARACTERISTICS
(Over the recommended operating conditions unless otherwise specified.)
ENDURANCE AND DATA RETENTION
CAPACITANCE
POWER-UP SEQUENCE
Symbol
I
CC1
Parameter
Limits
Typ.
Test Conditions
f
SCK
= 2MHz, SO = Open,
Other Inputs = V
SS
f
SCK
= 2MHz, SO = Open,
Other Inputs = V
SS
SCK = SI = V
SS
, Addr. = V
SS
V
IN
= V
SS
to V
CC
V
OUT
= V
SS
to V
CC
Min.
Max.
400
Unit
μA
V
CC
supply current (active)
I
CC2
V
CC
supply current (nonvolatile
write)
V
CC
current (standby)
Input leakage current
Output leakage current
Input HIGH voltage
Input LOW voltage
Output LOW voltage
1
mA
I
SB
I
LI
I
LO
V
IH
V
IL
V
OL
1
10
10
μA
μA
μA
V
V
V
V
CC
x 0.7
–0.5
V
CC
+ 0.5
V
CC
x 0.1
0.4
I
OL
= 3mA
Parameter
Minimum endurance
Data retention
Min.
100,000
100
Unit
Data changes per bit per register
Years
Symbol
C
I/O
C
IN
C
L
, C
H
, C
W
Test
Max.
8
6
10/10/25
Unit
pF
pF
pF
Test Conditions
V
OUT
= 0V
V
IN
= 0V
Output capacitance (SO)
Input capacitance (A0, A1, SI, and SCK)
Potentiometer capacitance
Power Up Sequence
(1)
: (1) V
CC
(2) V+ and V– {V+
V
CC
at all times}
Power Down Sequence: no limitation
A.C. TEST CONDITIONS
Note:
(1) Applicable to recall and power consumption applications
EQUIVALENT A.C. LOAD CIRCUIT
I
nput pulse levels
Input rise and fall times
Input and output timing level
V
CC
x 0.1 to V
CC
x 0.9
10ns
V
CC
x 0.5
5V
1533
100pF
SDA Output
2.7V
100pF
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