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參數(shù)資料
| 型號： | Z86C8416VEC |
| 廠商： | ZILOG INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | Z8 MCU MICROCONTROLLERS |
| 中文描述： | 8-BIT, MROM, 16 MHz, MICROCONTROLLER, PQCC28 |
| 封裝： | PLASTIC, LCC-28 |
| 文件頁數(shù)： | 5/46頁 |
| 文件大?。?/td> | 957K |
| 代理商： | Z86C8416VEC |
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Z86C83/C84
Z8
MCU Microcontrollers
DS96DZ80203
5
1
ABSOLUTE MAXIMUM RATINGS
Notice:
Stresses greater than those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. This is a stress rating only; functional operation of
the device at any condition above those indicated in the
operational sections of these specifications is not implied.
Exposure to absolute maximum rating conditions for an
extended period may affect device reliability.
Total power dissipation should not exceed 770 mW for the
package. Power dissipation is calculated as follows:
STANDARD TEST CONDITIONS
The characteristics listed below apply for standard test
conditions as noted. All voltages are referenced to
Ground. Positive current flows into the referenced pin
(Figure 6).
V
DD
SPECIFICATION
V
DD
= 3.0V to 5.5V
Parameter
Ambient Temperature under Bias
Storage Temperature
Voltage on any Pin with Respect to V
Voltage on V
CC
Pin with Respect to V
Voltage on /RESET Pins with Respect to V
Total Power Dissipation
Maximum Current out of V
Maximum Current into V
Maximum Current into an Input Pin [Note 3]
Maximum Current into an Open-Drain Pin [Note 4]
Maximum Output Current Sinked by Any I/O Pin
Maximum Output Current Sourced by Any I/O Pin
Min
–40
–65
–0.6
–0.3
–0.6
Max
+105
+150
+7
+7
V
CC
770
140
125
+600
+600
25
25
Units
C
C
V
V
V
mW
mA
mA
μ
A
μ
A
mA
mA
SS
[Note 1]
SS
SS
[Note 2]
+1
SS
CC
–600
–600
Notes:
1. This applies to all pins except XTAL and /RESET pins and where otherwise noted.
2. There is no input protection diode from pin to V
3. This excludes XTAL pins.
4. Device pin is not at an output Low state.
CC
.
Total Power Dissipation =
V
CC
x [ I
CC
– (sum of I
– V
OH
) ]
+ sum of [ (V
+ sum of (V
CC
OH
) x I
)
OH
]
0L
x I
0L
Figure 6. Test Load Diagram
From Output
Under Test
150 pF
I
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