參數(shù)資料
型號(hào): μPD434004
廠商: NEC Corp.
英文描述: 4M-Bit CMOS Fast Static RAM(4M位CMOS 快速靜態(tài))
中文描述: 4分位CMOS快速靜態(tài)隨機(jī)存儲(chǔ)器(4分位的CMOS快速靜態(tài))
文件頁(yè)數(shù): 9/14頁(yè)
文件大小: 98K
代理商: ΜPD434004
9
μ
PD434004
Test Mode
Test mode is used to test the memory cells in a shorter time than normal testing. Test mode reduces
test time to 1/2. In this test mode, internal organization is apparently 512K words by 8 bits. Input levels
of A19 pin do not need to be controlled.
1. How to enter test mode
To enter the test mode, execute the test mode set cycle.
2. Read/Write in test mode
Write data of “ 1” or “ 0” from I/O1 through I/O4. Write operation is performed with 2 bits written at once.
Therefore, 8-bit data in total are written at a write operation.
Then user should change the write operation to read operation to read judgement data. If the data is “ 1” ,
the cells operate correctly. If the data is “ 0” , they operate incorrectly. Repeating write/read operations
524 288 (512K) times checks 4M-bit of the memory.
3. How to exit from test mode
To exit the test mode, execute the test mode reset cycle.
Test Mode Set/Reset Cycle Timing Chart
Test Mode Set/Reset Cycle
μ
PD434004LE-20
μ
PD434004LE-25
Parameter
Symbol
Unit
MIN.
MAX .
MIN.
MAX .
Test mode set time
t
ST
30
30
ns
Test mode reset time
t
RT
30
30
ns
t
ST
TE (Input)
t
RT
Test Mode
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μPD434008 4M-Bit CMOS Fast Static RAM(4M位CMOS 快速靜態(tài))
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