參數(shù)資料
型號(hào): 28F008B3
廠商: Intel Corp.
英文描述: SMART 3 ADVANCED BOOT BLOCK BYTE-WIDE
中文描述: 智能3高級(jí)啟動(dòng)塊字節(jié)寬
文件頁(yè)數(shù): 33/49頁(yè)
文件大?。?/td> 408K
代理商: 28F008B3
E
SMART 3 ADVANCED BOOT BLOCK
–BYTE-WIDE
33
PRELIMINARY
TEST POINTS
INPUT
OUTPUT
V
CCQ
0.0
V
CCQ
2
V
CCQ
2
0605-011
NOTE:
AC test inputs are driven at V
for a logic
“1” and 0.0V for a logic “0.” Input timing begins, and output timing ends, at V
CCQ
/2.
Input rise and fall times (10%–90%) <10 ns. Worst case speed conditions are when V
CCQ
=2.7V.
Figure 10. 2.7V
–3.6V Input Range and Measurement Points
C
L
Out
V
CCQ
Device
under
Test
R
1
R
2
0605-012
NOTE:
See table for component values.
Figure 11. Test Configuration
Test Configuration Component Values
for Worst Case Speed Conditions
Test Configuration
C
L
(pF)
R
1
(
) R
2
(
)
2.7V Standard Test
50
25K
25K
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