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參數(shù)資料
| 型號(hào)： | 28LV64A-F-30I/L |
| 元件分類： | PROM |
| 英文描述： | 8K X 8 EEPROM 3V, 300 ns, PQCC32 |
| 封裝： | PLASTIC, LCC-32 |
| 文件頁(yè)數(shù)： | 4/10頁(yè) |
| 文件大?。?/td> | 130K |
| 代理商： | 28LV64A-F-30I/L |
2004 Microchip Technology Inc.
Preliminary
DS21113E-page 3
28LV64A
TABLE 1-3:
READ OPERATION AC CHARACTERISTICS
FIGURE 1-1:
READ WAVEFORMS
AC Testing Waveform:
Output Load:
Input Rise and Fall
Times:
Ambient Temperature:
VIH = 2.0V; VIL = 0.6V; VOH = VOL = VCC/2
1 TTL Load + 100 pF
20 ns
Commercial (C): Tamb =
0
°C to +70°C
Industrial
(I) : Tamb = -40
°C to +85°C
Parameter
Sym
28LV64-30
Units
Conditions
Min
Max
Address to Output Delay
tACC
—
300
ns
OE = CE = VIL
CE to Output Delay
tCE
—
300
ns
OE = VIL
OE to Output Delay
tOE
—
150
ns
CE = VIL
CE or OE High to Output Float
tOFF
060
ns
(Note 1)
Output Hold from Address, CE or
OE, whichever occurs first.
tOH
0—
ns
(Note 1)
Endurance
—
10M
—
cycles
25°C, Vcc = 5.0V,
Block Mode (Note 2)
Note 1: Not 100% tested.
2: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific
application, please consult the Total Endurance Model which can be obtained on our BBS or website.
Address
CE
VIH
VIL
VIH
VIL
VIH
VIL
OE
Data
WE
VOH
VOL
VIH
VIL
Address Valid
High Z
Valid Output
tACC
(1) tOFF is specified for OE or CE, whichever occurs first
(2) OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE
(3) This parameter is sampled and is not 100% tested
High Z
tOH
tOFF(1,3)
Notes:
tOE(2)
tCE(2)
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