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參數(shù)資料
| 型號(hào)： | 74ALS09 |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | Quad 2-Input AND Gate with Open Collector Outputs |
| 中文描述： | 四2輸入與門與集電極開路輸出 |
| 文件頁(yè)數(shù)： | 1/4頁(yè) |
| 文件大?。?/td> | 69K |
| 代理商： | 74ALS09 |
SN54ALS09, SN74ALS09
QUADRUPLE 2-INPUT POSITIVE-AND GATES
WITH OPEN-COLLECTOR OUTPUTS
SDAS084B – APRIL 1982 – REVISED DECEMBER 1994
Copyright
1994, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Package Options Include Plastic
Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These devices contain four independent 2-input
positive-AND gates. They perform the Boolean
functions Y = A
B or Y = A + B in positive logic.
The open-collector outputs require pullup
resistors to perform correctly. These outputs may
be connected to other open-collector outputs to
implement active-low wired-OR or active-high
wired-AND functions. Open-collector devices are
often used to generate higher V
OH
levels.
The SN54ALS09 is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74ALS09 is characterized for
operation from 0
°
C to 70
°
C.
FUNCTION TABLE
(each gate)
INPUTS
A
OUTPUT
Y
B
H
H
H
L
X
L
X
L
L
logic symbol
logic diagram (positive logic)
1
1A
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
&
1Y
3
2Y
6
3Y
8
4Y
11
1
1A
2
1B
1Y
3
4
2A
5
2B
2Y
6
9
3A
10
3B
3Y
8
12
4A
13
4B
4Y
11
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
SN54ALS09 . . . J PACKAGE
SN74ALS09 . . . D OR N PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
V
CC
4B
4A
4Y
3B
3A
3Y
SN54ALS09 . . . FK PACKAGE
(TOP VIEW)
3
2
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
1
1
N
3
3
V
4
2
N
C
NC – No internal connection
G
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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