參數(shù)資料
型號: 74FCT162500CTPVCT
廠商: Texas Instruments, Inc.
英文描述: 18-Bit Registered Transceivers
中文描述: 18位注冊收發(fā)器
文件頁數(shù): 2/6頁
文件大小: 63K
代理商: 74FCT162500CTPVCT
CY74FCT16500T
CY74FCT162500T
2
Maximum Ratings
[5, 6]
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Storage Temperature .......................Com’l
55
°
C to +125
°
C
Ambient Temperature with
Power Applied................................... Com’l
55
°
C to +125
°
C
DC Input Voltage
.................................................
0.5V to +7.0V
DC Output Voltage
..............................................
0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin)
...........................
60 to +120 mA
Power Dissipation..........................................................1.0W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Pin Summary
Name
OEAB
OEBA
LEAB
LEBA
CLKAB
CLKBA
A
B
Description
A-to-B Output Enable Input
B-to-A Output Enable Input (Active LOW)
A-to-B Latch Enable Input
B-to-A Latch Enable Input
A-to-B Clock Input (Active LOW)
B-to-A Clock Input (Active LOW)
A-to-B Data Inputs or B-to-A Three-State Outputs
B-to-A Data Inputs or A-to-B Three-State Outputs
Function Table
[1, 2]
Inputs
Outputs
B
Z
L
H
L
H
B
[3]
B
[4]
OEAB
L
H
H
H
H
H
H
LEAB
X
H
H
L
L
L
L
CLKAB
X
X
X
A
X
L
H
L
H
X
X
H
L
Operating Range
Range
Ambient
Temperature
V
CC
Industrial
40
°
C to +85
°
C
5V
±
10%
Electrical Characteristics
Over the Operating Range
Parameter
V
IH
V
IL
V
H
V
IK
I
IH
I
IL
I
OZH
Description
Test Conditions
Min.
2.0
Typ.
[7]
Max.
Unit
V
V
mV
V
μ
A
μ
A
μ
A
Input HIGH Voltage
Input LOW Voltage
Input Hysteresis
[8]
Input Clamp Diode Voltage
Input HIGH Current
Input LOW Current
High Impedance Output Current
(Three-State Output pins)
High Impedance Output Current
(Three-State Output pins)
Short Circuit Current
[9]
Output Drive Current
[9]
Power-Off Disable
0.8
100
0.7
V
CC
=Min., I
IN
=
18 mA
V
CC
=Max., V
I
=V
CC
V
CC
=Max., V
I
=GND.
V
CC
=Max., V
OUT
=2.7V
1.2
±
1
±
1
±
1
I
OZL
V
CC
=Max., V
OUT
=0.5V
±
1
μ
A
I
OS
I
O
I
OFF
Notes:
1.
2.
3.
4.
5.
V
CC
=Max., V
OUT
=GND
V
CC
=Max., V
OUT
=2.5V
V
CC
=0V, V
OUT
4.5V
[10]
80
50
140
200
180
±
1
mA
mA
μ
A
H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = HIGH Impedance.
A-to-B data flow is shown, B-to-A data flow is similar but uses OEBA, LEBA, andCLKBA.
Output level before the indicated steady-state input conditions were established.
Output level before the indicated steady-state input conditions were established, provided that CLKAB was LOW before LEAB went LOW.
Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
Typical values are at V
= 5.0V, T
= +25C ambient.
This parameter is specified but not tested.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
tests should be performed last.
10. Tested at +25C.
= HIGH-to-LOW Transition.
6.
7.
8.
9.
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