參數(shù)資料
型號: A1361LKTTN-T
元件分類: 磁阻傳感器
英文描述: MAGNETIC FIELD SENSOR-HALL EFFECT, 4.65-4.80V, RECTANGULAR, THROUGH HOLE MOUNT
封裝: LEAD FREE, PLASTIC, SIP-4
文件頁數(shù): 16/25頁
文件大?。?/td> 615K
代理商: A1361LKTTN-T
A1360, A1361,
and A1362
The flux density measured by the A136x SIP is related to the
size of the gap cut into the core. The larger the gap in the core,
the smaller the flux density per ampere of applied current (see
figure 8).
Figure 9 depicts the magnetic flux density through the center of
the SIP as a function of SIP to core alignment. Note that a core
with a larger cross-sectional area would reduce the attenuation
in flux density that results from any SIP misalignment. The flat
portion of the curve in figure 9 would span a larger distance in
millimeters if the cross-sectional area of the core were increased.
Wire
+B
mm
–2
2
0
Ring concentrator
Magnetic flux in gap
Measurement plane
(midplane of gap)
Figure 9. Side view of example current-conducting wire and split ring concentrator (left), and
magnetic prole (right) through the midplane of the gap in the split ring concentrator. The ux
denisty through the center of the gap varies between the inside and the outside of the gap.
7.0
6.5
6.0
5.5
5.0
4.5
4.0
3.5
3.0
–2.0
Radial Displacement from Concentrator Centerline (mm)
Interior side of
Concentrator
Exterior side of
Concentrator
Magnetic
Flux
Intensity
,B
(G)
–1.0
1.0
2.0
0
Figure 8. The flux density per ampere measured by the A136x Hall sen-
sor IC is related to the core gap, as shown. This figure assumes that the
current sensing application is constructed using the example setup.
Flux Density per Ampere vs. Gap for a Feedthrough Sensor
0
2
4
6
8
10
12
14
0.5
1
1.5
2
2.5
3
3.5
Gap (mm)
G
/A
a
tthe
G
a
p
C
e
nte
r
Low-Noise Programmable Linear Hall Effect Sensor ICs with
Adjustable Bandwidth (50 kHz Maximum) and Analog Output
23
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
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