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參數(shù)資料
| 型號(hào)： | A5303SLETR-T |
| 廠商： | Allegro Microsystems Inc |
| 文件頁數(shù)： | 10/15頁 |
| 文件大小： | 0K |
| 描述： | IC SMOKE DETECTOR PHOTO 20TSSOP |
| 特色產(chǎn)品： | A5303 Standard 3V Smoke Detector IC |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 類型： | 煙霧探測(cè)器 |
| 輸入類型： | 光電 |
| 輸出類型： | 電壓 |
| 電流 - 電源： | 300µA |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 20-TSSOP（0.173"，4.40mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 20-TSSOP |
| 包裝： | 標(biāo)準(zhǔn)包裝 |
| 其它名稱： | 620-1346-6 |
Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
4
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Continued on the next page…
AC ELECTRICAL CHARACTERISTICS1 Valid at TA = 25°C, VDD = 2.3 to 5.5 V, configured as in Typical Application Diagram
(unless otherwise noted)
Characteristics
Symbol
Test Conditions
OSC
Count
Min.
Typ.2
Max.
Unit
Oscillator Period
tosc
1
9.4
10.5
11.5
ms
Smoke Check
tsmoke
210
9.6
10.75
11.9
s
Low Battery Test
tbattery
No low-battery detected
218
41.3
45.9
50.5
min
tbattery2
Low-battery detected
212
39
43
48
s
Degraded Chamber Test
tchamber
No degraded chamber detected
218
41.3
45.9
50.5
min
tchamber2
Degraded chamber detected
212
39
43
48
s
LED Pulse Period
tled0
No local or remote smoke, BLINK = VSS
–
No
LED
Pulses
–
tled1
No local or remote smoke, BLINK = VDD
212
39
43
48
s
tled3
Local smoke
48
0.45
0.50
0.55
s
tled4
Remote smoke only
–
No
LED
Pulses
–
tled6
Pushbutton test, induced alarm
48
0.45
0.50
0.55
s
tled7
Timer mode, no alarm
210
9.67
10.75
11.83
s
LED Pulse Width
tw(led)
1
9.5
10.5
11.5
ms
LED Pulse Spacing
tsp(led)
3 pulses, degraded chamber
26
0.60
0.67
0.74
s
STROBE Pulse Period
tst1
No local or remote smoke
210
9.6
10.75
11.9
s
tst2
After 1 of 3 valid samples
192
1.8
2.0
2.2
s
tst3
After 2 of 3 valid samples and during local alarm
96
0.8
1.0
1.1
s
tst4
Remote smoke only
768
7.2
8.0
8.9
s
tst5
Chamber test, no local alarm
218
41.3
45.9
50.5
min
tst6
Pushbutton test, induced alarm
24
225
252
278
ms
STROBE Pulse Width
tw(st)
1
9.5
10.5
11.5
ms
IRED Pulse Period
tired1
No local or remote smoke
210
9.6
10.75
11.9
s
tired2
After 1 of 3 valid samples
192
1.8
2.0
2.2
s
tired3
After 2 of 3 valid samples and during local alarm
96
0.8
1.0
1.1
s
tired4
Remote smoke only
768
7.2
8.0
8.9
s
tired5
Chamber test, no local alarm
218
41.3
45.9
50.5
min
tired6
Pushbutton test, induced alarm
24
225
252
278
ms
IRED Pulse Width
tw(ired)
0.01
94
105
116
μs
I/O to Active Delay
td(io)
Local alarm
–
0
–
s
I/O Charge Dump Duration
tdump
End of local alarm or test
96
0.9
1.0
1.1
s
Rising Edge on I/O to Alarm
tr(io)
No local alarm
9 to 13
9 ×
tosc
94.5 –
137
13 ×
tosc
ms
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