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參數(shù)資料
| 型號(hào)： | A5303SLETR-T |
| 廠商： | Allegro Microsystems Inc |
| 文件頁(yè)數(shù)： | 14/15頁(yè) |
| 文件大小： | 0K |
| 描述： | IC SMOKE DETECTOR PHOTO 20TSSOP |
| 特色產(chǎn)品： | A5303 Standard 3V Smoke Detector IC |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 類型： | 煙霧探測(cè)器 |
| 輸入類型： | 光電 |
| 輸出類型： | 電壓 |
| 電流 - 電源： | 300µA |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 20-TSSOP（0.173"，4.40mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 20-TSSOP |
| 包裝： | 標(biāo)準(zhǔn)包裝 |
| 其它名稱： | 620-1346-6 |
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Photoelectric Smoke Detector
with Interconnect, Timer, and Latching Alarm Indicator
A5303
8
Allegro MicroSystems, Inc.
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
increased by internal selection of C1 so that background reflec-
tions in the smoke chamber can be used to simulate a smoke con-
dition, and IRED pulses every 252 ms (nominal). After the third
IRED pulse (three consecutive simulated smoke conditions), the
successful test signals a continuous passing-test-alarm condition
to the sound IC, outputs the temporal pattern to the piezo horn,
and activates the I/O pin. When the pushbutton is released, the
input returns to VSS due to the internal pulldown. After one oscil-
lator cycle, the amplifier gain returns to normal, and after three
additional IRED pulses (less than one second), the device exits
this mode and returns to standby. This high-to-low transition on
TEST also resets and starts the 10-minute (nominal) “hush” timer
mode, if the mode is enabled via the HUSH pin. The high-to-low
transition also resets the latching alarm indicator, if it is latched.
If the chamber malfunctions or is too dirty, the push-test will fail
to simulate a smoke condition, and after three failed STROBE
pulses the device signals a continuous failing-test-alarm condi-
tion on the SOUTx pins. The piezo driver and the I/O pins are not
enabled.
Diagnostic Test/Calibration mode is available to facilitate calibra-
tion and test of the IC and the assembled detector. It is initiated
by pulling TEST below VSS by continuously drawing 200 μA
from the pin for at least one clock cycle on OSC CAP. The cur-
rent should not exceed 500 μA and under these conditions,
TEST pin voltage will clamp at approximately 250 mV below
VSS. One option is to connect TEST to a –5 V supply through a
15 kΩ resistor. In this mode, certain device pins are reconfigured
as described in table 1. The IRED pulse rate is increased to one
pulse every OSC CAP cycle and the STROBE pin is always
active. To exit this mode, the TEST pin should be floated, or
returned to VSS, for at least one OSC CAP cycle.
Latching Alarm Indicator
When multiple smoke detectors are networked through the I/O
line, the latching alarm indicator allows the user to identify which
detector(s) initiated an alarm. When a local alarm condition
occurs, the initiating detector(s) will latch the event in memory.
After the alarm condition has expired (the device stops signaling
the alarm condition to the sound IC) the initiating detector(s) will
output an additional 10 ms LED pulse every 43 seconds. If the
BLINK pin is connected to VDD, the additional pulse will occur
0.67 seconds after the normal standby pulse. The user can clear
the latched alarm condition by pressing and releasing the push-to-
test button. If the user does not press the push-to-test button, the
latched alarm condition will cease after 24 hours to preserve bat-
tery life, and to prevent masking future latched alarm indications.
Alarm Indications
Alarm conditions include: local smoke detection, a remote alarm,
low battery, and degraded chamber sensitivity. These are indi-
cated by a combination of SOUTx output, piezo horn, and LED
signals, which continue until the alarm condition is resolved.
A local alarm always overrides a remote alarm and a push-test.
Remote alarm always overrides a push-test. A local alarm, remote
alarm, or a push-test will inhibit warning signals for low battery
or degraded chamber.
During a local or a remote alarm condition, the device continu-
ously signals an alarm condition on the SOUTx pins that indi-
cates the type of the alarm. The piezo horn output is a continuous
modulated tone (temporal horn pattern), nominally: 0.5 s on, 0.5 s
off, 0.5 s on, 0.5 s off, 0.5 s on, and 1.5 s off. The visible LED
also distinguishes a local alarm from a remote alarm. During a
Table 1. Alternate Pin Configuration During Diagnostic
Test/Calibration Mode
Pin Name
Alternate Configuration
I/O
Disabled as an output. A logic high on this pin places the
photoamplifier output on the BLINK pin. The amplifier
output appears as pulses.
HUSH
If the I/O pin is high, this pin controls the amplifier gain
capacitor. If this pin is low, normal gain is selected. If this
pin is high, supervisory gain is selected.
NOTE: If I/O is low, clocking this pin will cause the
device to exit diagnostic/calibration mode and enter an
Allegro-defined test mode.
BLINK
If the I/O pin is high, this pin is reconfigured as the
photoamplifier output.
SOUT0
If the I/O pin is high and the HUSH pin is low (normal
gain), taking this pin to a high logic level increases the
amplifier gain by ≈45% (hysteresis).
SOUT2
This pin is reconfigured as the smoke integrator output.
Three consecutive smoke detections will cause this pin
to go high and three consecutive no-smoke detections
cause this pin to go low.
LED
This pin becomes a low-battery indicator. The open-
drain NMOS output is normally off. If VDD falls below the
low-battery threshold, the output turns on.
OSC CAP
This pin may be driven by an external clock source.
Driving this pin low and high drives the internal clock low
and high. The external RC network may remain intact.
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