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參數(shù)資料
| 型號： | AD5664BCPZ-REEL7 |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 5/24頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC DAC NANO 16BIT QUAD 10-LFCSP |
| 產(chǎn)品培訓(xùn)模塊： | Data Converter Fundamentals DAC Architectures |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | nanoDAC™ |
| 設(shè)置時間： | 4µs |
| 位數(shù)： | 16 |
| 數(shù)據(jù)接口： | DSP，MICROWIRE?，QSPI?，串行，SPI? |
| 轉(zhuǎn)換器數(shù)目： | 4 |
| 電壓電源： | 單電源 |
| 工作溫度： | -40°C ~ 105°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 10-WFDFN 裸露焊盤，CSP |
| 供應(yīng)商設(shè)備封裝： | 10-LFCSP-WD（3x3） |
| 包裝： | 標(biāo)準(zhǔn)包裝 |
| 輸出數(shù)目和類型： | 4 電壓，單極；4 電壓，雙極 |
| 采樣率（每秒）： | 223k |
| 產(chǎn)品目錄頁面： | 783 (CN2011-ZH PDF) |
| 配用： | EVAL-AD5664REBZ-ND - BOARD EVALUATION FOR AD5664R |
| 其它名稱： | AD5664BCPZ-REEL7DKR |
AD5624/AD5664
Rev. 0 | Page 13 of 24
TERMINOLOGY
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy or integral nonlinearity is a
measurement of the maximum deviation, in LSBs, from a
straight line passing through the endpoints of the DAC transfer
function. A typical INL vs. code plot can be seen in Figure 4
and Figure 5.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL vs. code plot can be seen in Figure 6 and
Zero-Scale Error
Zero-scale error is a measurement of the output error when
zero code (0x0000) is loaded to the DAC register. Ideally, the
output should be 0 V. The zero-code error is always positive in
the AD5624/AD5664 because the output of the DAC cannot go
below 0 V. It is due to a combination of the offset errors in the
DAC and the output amplifier. Zero-code error is expressed in
mV. A plot of zero-code error vs. temperature can be seen in
Full-Scale Error
Full-scale error is a measurement of the output error when full-
scale code (0xFFFF) is loaded to the DAC register. Ideally, the
output should be VDD 1 LSB. Full-scale error is expressed in %
of FSR. A plot of full-scale error vs. temperature can be seen in
Gain Error
This is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal
expressed as a % of FSR.
Zero-Code Error Drift
This is a measurement of the change in zero-code error with a
change in temperature. It is expressed in μV/°C.
Gain Temperature Coefficient
This is a measurement of the change in gain error with changes
in temperature. It is expressed in ppm of FSR/°C.
Offset Error
Offset error is a measure of the difference between VOUT (actual)
and VOUT (ideal) expressed in mV in the linear region of the
transfer function. Offset error is measured on the AD5624/
AD5664 with code 512 loaded in the DAC register. It can be
negative or positive.
DC Power Supply Rejection Ratio (PSRR)
This indicates how the output of the DAC is affected by changes
in the supply voltage. PSRR is the ratio of the change in VOUT to
a change in VDD for full-scale output of the DAC. It is measured
in dB. VREF is held at 2 V, and VDD is varied by ±10%.
Output Voltage Settling Time
This is the amount of time it takes for the output of a DAC to
settle to a specified level for a to full-scale input change
and is measured from the 24th falling edge of SCLK.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s,
and is measured when the digital input code is changed by
1 LSB at the major carry transition (0x7FFF to 0x8000) as
shown in Figure 22.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s, and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s and vice versa.
Total Harmonic Distortion (THD)
This is the difference between an ideal sine wave and its
attenuated version using the DAC. The sine wave is used as the
reference for the DAC, and the THD is a measurement of the
harmonics present on the DAC output. It is measured in dB.
Noise Spectral Density
This is a measurement of the internally generated random
noise. Random noise is characterized as a spectral density
(nV/√Hz). It is measured by loading the DAC to midscale and
measuring noise at the output. It is measured in nV/√Hz. A plot
of noise spectral density can be seen in Figure 27.
DC Crosstalk
DC crosstalk is the dc change in the output level of one DAC in
response to a change in the output of another DAC. It is
measured with a full-scale output change on one DAC (or soft
power-down and power-up) while monitoring another DAC kept
at midscale. It is expressed in μV.
DC crosstalk due to load current change is a measure of the
impact that a change in load current on one DAC has to
another DAC kept at midscale. It is expressed in μV/mA.
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| AD5664BRMZ | 功能描述:IC DAC NANO 16BIT QUAD 10-MSOP RoHS:是 類別:集成電路 (IC) >> 數(shù)據(jù)采集 - 數(shù)模轉(zhuǎn)換器 系列:nanoDAC™ 產(chǎn)品培訓(xùn)模塊:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 標(biāo)準(zhǔn)包裝:50 系列:- 設(shè)置時間:4µs 位數(shù):12 數(shù)據(jù)接口:串行 轉(zhuǎn)換器數(shù)目:2 電壓電源:單電源 功率耗散（最大）:- 工作溫度:-40°C ~ 85°C 安裝類型:表面貼裝 封裝/外殼:8-TSSOP，8-MSOP（0.118"，3.00mm 寬） 供應(yīng)商設(shè)備封裝:8-uMAX 包裝:管件 輸出數(shù)目和類型:2 電壓，單極 采樣率（每秒）:* 產(chǎn)品目錄頁面:1398 (CN2011-ZH PDF) |
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