TIMING CHARACTERISTICS1, 2 (AVDD
參數(shù)資料
型號(hào): AD7701AR
廠商: Analog Devices Inc
文件頁(yè)數(shù): 17/20頁(yè)
文件大小: 0K
描述: IC ADC 16BIT LC2MOS 20-SOIC
標(biāo)準(zhǔn)包裝: 1
位數(shù): 16
采樣率(每秒): 4k
數(shù)據(jù)接口: 串行
轉(zhuǎn)換器數(shù)目: 1
功率耗散(最大): 37mW
電壓電源: 模擬和數(shù)字,雙 ±
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 20-SOIC(0.295",7.50mm 寬)
供應(yīng)商設(shè)備封裝: 20-SOIC W
包裝: 管件
輸入數(shù)目和類型: 1 個(gè)單端,單極;1 個(gè)單端,雙極
REV. E
–6–
AD7701
TIMING CHARACTERISTICS1, 2
(AVDD = DVDD = +5 V
10%; AVSS = DVSS = –5 V
10%; AGND = DGND = O V; fCLKIN =
4.096 MHz; Input Levels: Logic O = O V, Logic 1 = DVDD; unless otherwise noted.)
Limit at TMIN, TMAX Limit at TMIN, TMAX
Parameter
(A, B Versions)
(S, T Versions)
Unit
Conditions/Comments
fCLKIN
3, 4
200
kHz min
Master Clock Frequency: Internal Gate Oscillator.
55
MHz max
Typically 4.096 MHz.
200
kHz min
Master Clock Frequency: Externally Supplied.
55
MHz max
tr
5
50
ns max
Digital Output Rise Time. Typically 20 ns.
tf
5
50
ns max
Digital Output Fall Time. Typically 20 ns.
t1
00
ns min
SC1, SC2 to CAL High Setup Time.
t2
50
ns min
SC1, SC2 Hold Time after CAL Goes High.
t3
6
1000
ns min
SLEEP High to CLKIN High Setup Time.
SSC MODE
t4
7
3/fCLKIN
ns max
Data Access Time (
CS Low to Data Valid).
t5
100
ns max
SCLK Falling Edge to Data Valid Delay (25 ns typ).
t6
250
ns min
MSB Data Setup Time. Typically 380 ns.
t7
300
ns max
SCLK High Pulsewidth. Typically 240 ns.
t8
790
ns max
SCLK Low Pulsewidth. Typically 730 ns.
t9
8
l/fCLKIN +200
ns max
SCLK Rising Edge to Hi-Z Delay (l/fCLKIN + 100 ns typ).
t10
8, 9
(4/fCLKIN) +200
ns max
CS High to Hi-Z Delay.
SEC MODE
fSCLK
55
MHz
Serial Clock Input Frequency.
t11
35
ns min
SCLK Input High Pulsewidth.
t12
160
ns min
SCLK Low Pulsewidth.
t13
7, 10
160
ns max
Data Access Time (
CS Low to Data Valid). Typically 80 ns.
t14
11
150
ns max
SCLK Falling Edge to Data Valid Delay. Typically 75 ns.
t15
8
250
ns max
CS High to Hi-Z Delay.
t16
8
200
ns max
SCLK Falling Edge to Hi-Z Delay. Typically 100 ns.
AC MODE
t17
40
ns min
CS Setup Time. Typically 20 ns.
t18
180
ns max
Data Delay Time. Typically 90 ns.
t19
200
ns max
SCLK Falling Edge to Hi-Z Delay. Typically 100 ns.
NOTES
1Sample tested at 25
°C to ensure compliance. All input signals are specified with t
r = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2See Figures 1 to 6.
3CLKIN duty cycle range is 20% to 80%. CLKIN must be supplied whenever the AD7701 is not in SLEEP mode. If no clock is present in this case, the device can
draw higher current than specified and possibly become uncalibrated.
4The AD7701 is production tested with f
CLKIN at 4.096 MHz. It is guaranteed by characterization to operate at 200 kHz.
5Specified using 10% and 90% points on waveform of interest.
6In order to synchronize several AD7701s together using the
SLEEP pin, this specification must be met.
7t
4 and t13 are measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
8t
9, t10, t15, and t16 are derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number
is then extrapolated back to remove the effects of charging or discharging the 100 pF capacitor. This means that the time quoted in the Timing Characteristics is
the true bus relinquish time of the part and as such is independent of external bus loading capacitance.
9If
CS is returned high before all 16 bits are output, the SDATA and SCLK outputs will complete the current data bit and then go to high impedance.
10If
CS is activated asynchronously to DRDY, CS will not be recognized if it occurs when DRDY is high for four clock cycles. The propagation delay time may be
as great as four CLKIN cycles plus 160 ns. To guarantee proper clocking of SDATA when using asynchronous
CS, the SCLK input should not be taken high
sooner than four CLKIN cycles plus 160 ns after
CS goes low.
11SDATA is clocked out on the falling edge of the SCLK input.
Specifications subject to change without notice.
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