參數(shù)資料
型號(hào): AD9751-EB
廠商: Analog Devices Inc
文件頁(yè)數(shù): 24/28頁(yè)
文件大?。?/td> 0K
描述: BOARD EVAL FOR AD9751
產(chǎn)品培訓(xùn)模塊: DAC Architectures
標(biāo)準(zhǔn)包裝: 1
系列: TxDAC®
DAC 的數(shù)量: 1
位數(shù): 10
采樣率(每秒): 300M
數(shù)據(jù)接口: 并聯(lián)
設(shè)置時(shí)間: 11ns
DAC 型: 電流
工作溫度: -40°C ~ 85°C
已供物品:
已用 IC / 零件: AD9751
相關(guān)產(chǎn)品: AD9751ASTZRL-ND - IC DAC 10BIT 300MSPS 48LQFP
AD9751ASTZ-ND - IC DAC 10BIT 300MSPS 48-LQFP
REV. C
AD9751
–5–
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD9751 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ORDERING GUIDE
Temperature
Package
Model
Range
Description
Option
AD9751AST
–40
°C to +85°C 48-Lead LQFP ST-48
AD9751ASTRL –40
°C to +85°C 48-Lead LQFP ST-48
AD9751-EB
Evaluation
Board
THERMAL CHARACTERISTIC
Thermal Resistance
θJA = 91°C/W
PORT 1
DATA X
DATA Y
tH
tS
tLPW
tPD
DATA X
DATA Y
tPD
PORT 2
IOUTA OR IOUTB
INPUT CLK
(PLL ENABLED)
DATA IN
Figure 1. I/O Timing
ABSOLUTE MAXIMUM RATINGS
*
Parameter
With Respect to
Min
Max
Unit
AVDD, DVDD, CLKVDD, PLLVDD
ACOM, DCOM, CLKCOM, PLLCOM
–0.3
+3.9
V
AVDD, DVDD, CLKVDD, PLLVDD
–3.9
+3.9
V
ACOM, DCOM, CLKCOM, PLLCOM
–0.3
+0.3
V
REFIO, REFLO, FSADJ
ACOM
–0.3
AVDD + 0.3
V
IOUTA, IOUTB
ACOM
–1.0
AVDD + 0.3
V
Digital Data Inputs (DB9 to DB0)
DCOM
–0.3
DVDD + 0.3
V
CLK+/CLK–, PLLLOCK
CLKCOM
–0.3
CLKVDD + 0.3
V
DIV0, DIV1, RESET
CLKCOM
–0.3
CLKVDD + 0.3
V
LPF
PLLCOM
–0.3
PLLVDD + 0.3
V
Junction Temperature
150
°C
Storage Temperature
–65
+150
°C
Lead Temperature (10 sec)
300
°C
*Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device
at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum ratings for extended
periods may affect device reliability.
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