參數(shù)資料
型號: ADC12041
廠商: National Semiconductor Corporation
英文描述: 12-Bit Plus Sign 216 kHz Sampling Analog-to-Digital Converter(12位216 kHz采樣A/D轉(zhuǎn)換器)
中文描述: 12位帶符號216 kHz的采樣模擬到數(shù)字轉(zhuǎn)換器(12位216 kHz的采樣的A / D轉(zhuǎn)換器)
文件頁數(shù): 8/28頁
文件大小: 591K
代理商: ADC12041
Notes on Specifications
(Continued)
Note 17:
The ADC12041’s self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will result in
a repeatability uncertainty of
±
0.20 LSB.
Note 18:
Total Unadjusted Error (TUE) includes offset, full scale linearity and MUX errors.
Note 19:
The ADC12041 parts used to gather the information for these curves were auto-calibrated prior to taking the measurements at each test condition. The
auto-calibration cycle cancels any first order drifts due to test conditions. However, each measurement has a repeatability uncertainty error of 0.2 LSB. See Note
17.
Note 20:
The reference input current is a DC average current drawn by the reference input with a full-scale sinewave input. The ADC12041 is continuously con-
verting with a throughput rate of 206 kHz.
Note 21:
These typical curves were measured during continuous conversions with a positive half-scale DC input. A 240 ns RD pulse was applied 25 ns after the
RDY signal went low. The data bus lines were loaded with 2 HC family CMOS inputs (C
L
20 pF).
Note 22:
Any other values placed in the command field are meaningless. However, if a code of 101 or 110 is placed in the command field and the CS , RD and WR
go low at the same time, the ADC12041 will enter a test mode. These test modes are only to be used by the manufacturer of this device. A hardware power-off and
power-on reset must be done to get out of these test modes.
Electrical Characteristics
DS012441-5
FIGURE 1. Output Digital Code vs the Operating Input Voltage Range (General Case)
A
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