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參數(shù)資料
| 型號： | ADC1251CMJ |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | ADC |
| 英文描述： | Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold |
| 中文描述： | 1-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, CDIP24 |
| 封裝： | CERAMIC, DIP-24 |
| 文件頁數(shù)： | 15/16頁 |
| 文件大?。?/td> | 301K |
| 代理商： | ADC1251CMJ |
4.0 Dynamic Performance
(Continued)
Two sample/hold specifications, aperture time and aperture
jitter, are included in the Dynamic Characteristics table
since the ADC1251 has the ability to track and hold the
analog input voltage. Aperture time is the delay for the A/D
to respond to the hold command. In the case of the
ADC1251 when using the S/H control to start a conversion,
the hold command is generated by the rising edge of S/H.
The delay between the rising edge of S/H and the time that
the ADC1251 actually holds the input signal is the aperture
time. For the ADC1251, this time is typically 100 ns. Aper-
ture jitter is the change in the aperture time from sample to
sample. Aperture jitter is useful in determining the maximum
slew rate of the input signal for a given accuracy. For exam-
ple, an ADC1251 with 100 ps of aperture jitter operating with
a 5V reference can have an effective gain variation of about
1 LSB with an input signal whose slew rate is 12 V/
m
s.
5.0 Typical Applications
Power Supply Bypassing
TL/H/11024–23
Protecting the Analog Inputs
TL/H/11024–24
Note:
External protection diodes should be able to withstand the op amp current limit.
15
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| ADC1251CMJ/883 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold |
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