參數(shù)資料
型號: ADM1033ARQ-REEL
廠商: ON SEMICONDUCTOR
元件分類: 溫度/濕度傳感器
英文描述: DIGITAL TEMP SENSOR-SERIAL, 8BIT(s), 2Cel, RECTANGULAR, SURFACE MOUNT
封裝: MO-137AB, QSOP-16
文件頁數(shù): 9/39頁
文件大小: 819K
代理商: ADM1033ARQ-REEL
ADM1033
Rev. 0 | Page 17 of 40
D+
D–
REMOTE
SENSING
TRANSISTOR
I
N1 I
N2 I
IBIAS
VDD
VOUT+
TO ADC
VOUT–
LOW-PASS FILTER
fC = 65kHz
04
93
7-
0-
02
7
Figure 28. ADM1033 Signal Conditioning
The ADM1033 operates at three different currents to measure
the change in VBE.
Figure 28 shows the input signal conditioning used to measure
the output of an external temperature sensor. It also shows the
external sensor as a substrate transistor, provided for
temperature monitoring on some microprocessors. The external
sensor works equally well as a discrete transistor.
If a discrete transistor is used, the collector is not grounded and
should be linked to the base. If a PNP transistor is used, the base
is connected to the D input and the emitter to the D+ input. If
an NPN transistor is used, the emitter is connected to the D
input and the base to the D+ input.
If the sensor is used in a very noisy environment, a capacitor
value of up to 1000 pF can be placed between the D+ and D
inputs to filter the noise. However, additional parasitic capaci-
tance on the lines between D+, D, and the thermal diode
should also be considered. The total capacitance should never
be greater than 1000 pF.
To measure each VBE, the sensor is switched between operat-
ing currents of I, (N1 × I), and (N2 × I). The resulting waveform
is passed through a 65 kHz low-pass filter to remove noise, then
to a chopper-stabilized amplifier that amplifies and rectifies the
waveform. This produces a dc voltage proportional to VBE.
These measurements are used to determine the temperature of
the thermal diode, while automatically compensating for any
series resistance on the D+ and/or D lines. The temperature is
stored in two registers as a 13-bit word.
To further reduce the effects of noise, digital filtering is per-
formed by averaging the results of 16 measurement cycles at
conversion rates of less than 16 Hz. An external temperature
measurement takes nominally 32 ms when averaging is enabled
and 6 ms when averaging is disabled.
One LSB of the ADC corresponds to 0.03125°C. The ADM1033
can theoretically measure temperatures from 64°C to
+191.96875°C, although 64°C and +191°C are outside its
operating range. The extended temperature resolution data
format is shown in Table 8. The extended temperature
resolution for the local and remote channels is stored in the
extended temperature resolution registers (Reg. 0x40 = Local,
Reg. 0x42 = Remote).
Table 9. Temperature Measurement Registers
Register
Description
Default
0x40
Local Temperature, LSBs
0x00
0x41
Local Temperature, MSBs
0x00
0x42
Remote Temperature, LSBs
0x00
0x43
Remote Temperature, MSBs
0x00
High and low temperature limit registers are associated with
each temperature measurement channel. The appropriate status
bit is set when the high and low limits are exceeded. Exceeding
either limit can cause an SMBALERT interrupt.
Table 10. Temperature Measurement Limit Registers
Register
Description
Default
0x0B
Local High Limit
0x8B (75°C)
0x0C
Local Low Limit
0x54 (20°C)
0x0D
Local THERM Limit
0x95 (85°C)
0x0E
Remote High Limit
0x8B (75°C)
0x0F
Remote Low Limit
0x54 (20°C)
0x10
Remote THERM Limit
0x95 (85°C)
Rev. 1 | Page 17 of 39 | www.onsemi.com
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