- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄11722 > ADUC7039BCP6Z (Analog Devices Inc)IC MCU ARM7 BATT SENSER 32LFCSP PDF資料下載
參數(shù)資料
| 型號： | ADUC7039BCP6Z |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 40/92頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC MCU ARM7 BATT SENSER 32LFCSP |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | MicroConverter® ADuC7xxx |
| 核心處理器： | ARM7 |
| 芯體尺寸： | 16/32-位 |
| 速度： | 20.48MHz |
| 連通性： | LIN，SPI |
| 外圍設(shè)備： | POR，溫度傳感器，WDT |
| 輸入/輸出數(shù)： | 6 |
| 程序存儲器容量： | 64KB（32K x 16） |
| 程序存儲器類型： | 閃存 |
| RAM 容量： | 1K x 32 |
| 電壓 - 電源 (Vcc/Vdd)： | 3.5 V ~ 18 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 2x16b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 115°C |
| 封裝/外殼： | 32-VFQFN 裸露焊盤，CSP |
| 包裝： | 托盤 |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁第35頁第36頁第37頁第38頁第39頁當(dāng)前第40頁第41頁第42頁第43頁第44頁第45頁第46頁第47頁第48頁第49頁第50頁第51頁第52頁第53頁第54頁第55頁第56頁第57頁第58頁第59頁第60頁第61頁第62頁第63頁第64頁第65頁第66頁第67頁第68頁第69頁第70頁第71頁第72頁第73頁第74頁第75頁第76頁第77頁第78頁第79頁第80頁第81頁第82頁第83頁第84頁第85頁第86頁第87頁第88頁第89頁第90頁第91頁第92頁
Data Sheet
ADuC7039
Rev. D | Page 45 of 92
ADC Calibration
As shown in detail in the top level diagrams (Figure 11 and
Figure 12), the signal flow through all ADC channels can be
described in the following steps:
1. An input voltage is applied through an input buffer (and
PGA in the case of the I-ADC) to the Σ-Δ modulator.
2. The modulator output is applied to a programmable digital
decimation filter.
3. The filter output result is then averaged if chopping is used.
4. An offset value (ADCxOF) is subtracted from the result.
5. This result is scaled by a gain value (ADCxGN).
6. Finally, the result is formatted as twos complement/
unipolar, rounded to 16 bits, or clamped to ± full scale.
Each ADC channel (current, voltage, and temperature) has a
specific offset and gain correction or calibration coefficient
associated with it that are stored in MMR-based offset and
gain registers (ADCxOF and ADCxGN). The offset and gain
registers can be used to remove system level offset and gain
errors external to the part.
These registers are configured at power-on with a factory
programmed calibration value. These factory calibration
values vary from part to part reflecting the manufacturing
variability of internal ADC circuits. These registers can also
be overwritten by user code after a calibration.
On the current channel when a system calibration is initiated,
the ADC generates its calibration coefficient based on an
externally generated zero-scale voltage and full-scale voltage,
which are applied to the external ADC input for the duration
of the calibration cycle. The coefficients are written in the
ADC0DAT MMR of the ADC channels; they are not auto-
matically written in the ADC0OF or ADC0GN MMR. User
code must copy these values to their appropriate registers.
The duration of an offset calibration is a full ADC filter settling
time before returning the ADC to idle mode. When a calibra-
tion cycle is initiated, any ongoing ADC conversion is immediately
halted, the calibration is automatically carried out at an ADC
update rate programmed into ADCFLT, and the ADC is always
returned to idle after any calibration cycle. It is strongly recom-
mended that ADC calibration is initiated at as low an ADC
update rate as possible (high SF value in ADCFLT) to minimize
the impact of ADC noise during calibration.
On the voltage channel, a two-point calibration must be per-
formed as the minimum voltage specified on the input is 4 V.
The temperature channel is factory calibrated for the internal
temperature sensor.
Calibrating the Voltage Channel
To calibrate the offset and gain of the voltage channel a two-
point calibration method must be used. This method consists
of converting two known voltages (for example, 8 V and 16 V)
to determine lope and offset of the transfer function. The gain
coefficient can be divided by the calculated slope to improve
the gain error.
The offset error can be reduced by writing of the calculated
offset (in unipolar codes) into the ADC1OF MMR.
Calibrating the Current Channel
If the chop bit (ADCFLT[15]) is enabled, then internal ADC
offset errors are minimized and an offset calibration may not
be required. If chopping is disabled, however, an initial offset
calibration is required and may need to be repeated, particularly
after a large change in temperature.
A gain calibration, particularly in the context of the I-ADC
(with internal PGA), may need to be carried out at all relevant
system gain ranges depending on system accuracy requirements.
If it is not possible to apply an external full-scale current on all
gain ranges, then it is possible to apply a lower current and scale
the result produced by the calibration. For example, apply a 50%
current and then divide the ADC0DAT value produced-by-two
and write this value back into ADC0GN. Note that there is a
lower limit to the input signal that can be applied for a system
calibration because ADC0GN is only a 16-bit register. The
input span (difference between the system zero-scale value
and system full-scale value) should be greater than 40% of the
nominal full-scale-input range, that is, >40% of VREF/gain.
The on-chip Flash/EE memory can be used to store multiple
calibration coefficients. These can be copied by user code
directly into the relevant calibration registers, as appropriate,
based on the system configuration.
A factory, or end-of-line calibration, for the I-ADC is a two-
step procedure.
1. Apply the 0 A current. Configure the ADC in the required
PGA setting, and so on, and write to ADCMDE[2:0] to
perform a system zero-scale calibration. This writes a new
offset calibration value into ADC0DAT. User code must
store this value into ADC0OF or into Flash/EE memory.
2. Apply a full-scale current for the selected PGA setting.
Write to ADCMDE to perform a system full-scale cali-
bration. This writes a new gain calibration value into
ADC0DAT. This value must be copied by user software
to the ADC0GN MMR or into Flash/EE memory.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| ADUC7022BCPZ32 | IC MCU FLSH 32K ANLG I/O 40LFCSP |
| VE-BTJ-IX-F1 | CONVERTER MOD DC/DC 36V 75W |
| ADUC7023BCPZ62I | IC MCU 12BIT 62KB FLASH 32LFCSP |
| D38999/26MB98HN | CONN PLUG 6POS STRAIGHT W/PINS |
| VE-B7L-IW-F1 | CONVERTER MOD DC/DC 28V 100W |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| ADUC7039BCP6Z-RL | 功能描述:IC MCU ARM7 BATT SENSER 32LFCSP RoHS:否 類別:集成電路 (IC) >> 嵌入式 - 微控制器， 系列:MicroConverter® ADuC7xxx 標(biāo)準(zhǔn)包裝:38 系列:Encore!® XP® 核心處理器:eZ8 芯體尺寸:8-位 速度:5MHz 連通性:IrDA，UART/USART 外圍設(shè)備:欠壓檢測/復(fù)位，LED，POR，PWM，WDT 輸入/輸出數(shù):16 程序存儲器容量:4KB（4K x 8） 程序存儲器類型:閃存 EEPROM 大小:- RAM 容量:1K x 8 電壓 - 電源 (Vcc/Vdd):2.7 V ~ 3.6 V 數(shù)據(jù)轉(zhuǎn)換器:- 振蕩器型:內(nèi)部 工作溫度:-40°C ~ 105°C 封裝/外殼:20-SOIC（0.295"，7.50mm 寬） 包裝:管件 其它名稱:269-4116Z8F0413SH005EG-ND |
| ADUC7039WBCPZ | 制造商:Analog Devices 功能描述:FLASH 64K ARM7 DUAL 16-BIT ADC LIN I.C. - Trays 制造商:Analog Devices 功能描述:IC MCU ARM7 64KB FLASH 32LFCSP 制造商:Analog Devices 功能描述:Flash 64k ARM7 Dual 16-Bit ADC LIN I.C. |
| ADUC7039WBCPZ-RL | 制造商:Analog Devices 功能描述:FLASH 64K ARM7 DUAL 16-BIT ADC LIN I.C. - Tape and Reel 制造商:Analog Devices 功能描述:IC MCU ARM7 64KB FLASH 32LFCSP 制造商:Analog Devices 功能描述:Flash 64k ARM7 Dual 16-Bit ADC LIN I.C. |
| ADUC7060 | 制造商:AD 制造商全稱:Analog Devices 功能描述:Low Power, Precision Analog Microcontroller, Dual Sigma-Delta ADCs, Flash/EE, ARM7TDMI |
| ADUC7060BCPZ32 | 功能描述:IC MCU 24BIT 32KB FLASH 48LFCSP RoHS:是 類別:集成電路 (IC) >> 嵌入式 - 微控制器， 系列:MicroConverter® ADuC7xxx 產(chǎn)品培訓(xùn)模塊:MCU Product Line Introduction XMEGA Introduction AVR XMEGA USB Connectivity 標(biāo)準(zhǔn)包裝:90 系列:AVR® XMEGA 核心處理器:AVR 芯體尺寸:8/16-位 速度:32MHz 連通性:I²C，IrDA，SPI，UART/USART 外圍設(shè)備:欠壓檢測/復(fù)位，DMA，POR，PWM，WDT 輸入/輸出數(shù):50 程序存儲器容量:192KB（96K x 16） 程序存儲器類型:閃存 EEPROM 大小:4K x 8 RAM 容量:16K x 8 電壓 - 電源 (Vcc/Vdd):1.6 V ~ 3.6 V 數(shù)據(jù)轉(zhuǎn)換器:A/D 16x12b; D/A 2x12b 振蕩器型:內(nèi)部 工作溫度:-40°C ~ 85°C 封裝/外殼:64-TQFP 包裝:托盤 配用:ATSTK600-RC14-ND - STK600 SOCKET/ADAPTER 64TQFPATSTK600-TQFP64-ND - STK600 SOCKET/ADAPTER 64-TQFPATAVRONEKIT-ND - KIT AVR/AVR32 DEBUGGER/PROGRMMRATAVRISP2-ND - PROGRAMMER AVR IN SYSTEM |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。