Revision 13 2-109 JTAG 1532 Characteristics JTAG timing delays do not include JTAG I/Os. To obtain complete JTAG timi" />
參數資料
型號: AGLE3000V5-FGG896I
廠商: Microsemi SoC
文件頁數: 28/166頁
文件大小: 0K
描述: IC FPGA 1KB FLASH 3M 896-FBGA
標準包裝: 27
系列: IGLOOe
邏輯元件/單元數: 75264
RAM 位總計: 516096
輸入/輸出數: 620
門數: 3000000
電源電壓: 1.425 V ~ 1.575 V
安裝類型: 表面貼裝
工作溫度: -40°C ~ 85°C
封裝/外殼: 896-BGA
供應商設備封裝: 896-FBGA(31x31)
IGLOOe Low Power Flash FPGAs
Revision 13
2-109
JTAG 1532 Characteristics
JTAG timing delays do not include JTAG I/Os. To obtain complete JTAG timing, add I/O buffer delays to
the corresponding standard selected; refer to the I/O timing characteristics in the "User I/O
Timing Characteristics
Applies to 1.2 V DC Core Voltage
Applies to 1.5 V DC Core Voltage
Table 2-153 JTAG 1532
Commercial-Case Conditions: TJ = 70°C, VCC = 1.14 V
Parameter
Description
Std.
Units
tDISU
Test Data Input Setup Time
1.50
ns
tDIHD
Test Data Input Hold Time
3.00
ns
tTMSSU
Test Mode Select Setup Time
1.50
ns
tTMDHD
Test Mode Select Hold Time
3.00
ns
tTCK2Q
Clock to Q (data out)
11.00
ns
tRSTB2Q
Reset to Q (data out)
30.00
ns
FTCKMAX
TCK Maximum Frequency
9.00
MHz
tTRSTREM
ResetB Removal Time
1.18
ns
tTRSTREC
ResetB Recovery Time
0.00
ns
tTRSTMPW
ResetB Minimum Pulse
TBD
ns
Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-6 for derating values.
Table 2-154 JTAG 1532
Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter
Description
Std.
Units
tDISU
Test Data Input Setup Time
1.00
ns
tDIHD
Test Data Input Hold Time
2.00
ns
tTMSSU
Test Mode Select Setup Time
1.00
ns
tTMDHD
Test Mode Select Hold Time
2.00
ns
tTCK2Q
Clock to Q (data out)
8.00
ns
tRSTB2Q
Reset to Q (data out)
25.00
ns
FTCKMAX
TCK Maximum Frequency
15.00
MHz
tTRSTREM
ResetB Removal Time
0.58
ns
tTRSTREC
ResetB Recovery Time
0.00
ns
tTRSTMPW
ResetB Minimum Pulse
TBD
ns
Note: For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-6 for derating values.
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