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| 型號： | AT42QT1111-AU |
| 廠商： | ATMEL CORP |
| 元件分類： | 速度傳感器和接近開關(guān) |
| 英文描述： | PROXIMITY SENSOR-CAPACITIVE, 0-5V, SQUARE, SURFACE MOUNT |
| 封裝： | 7 X 7 MM, 1 MM HEIGHT, 0.80 MM PITCH, ROHS COMPLIANT, PLASTIC, MS-026ABA, TQFP-32 |
| 文件頁數(shù)： | 13/50頁 |
| 文件大?。?/td> | 637K |
| 代理商： | AT42QT1111-AU |
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20
9571B–AT42–08/10
AT42QT1111-MU/AT42QT1111-AU
With the guard channel not enabled, all the keys work normally.
Note:
If a key is already “in detect” when the guard channel becomes active, that key will
remain in detect and the guard key will not activate until the active key goes out of
detect.
Figure 4-9.
Guard Channel Example
4.10
Self-test Functions
4.10.1
Internal Hardware Tests
Internal hardware tests check for hardware failure in the device’s internal memory areas and
data paths. Any failure detected in the function or contents of application ROM, RAM or registers
causes the device to reset itself.
The application code is scanned with a CRC check routine to confirm that the application data is
all correct.
The RAM and registers are checked periodically (every 10 seconds) for dynamic and static
failures.
4.10.2
Functional Checks
Functional checks confirm that the device is operating within expected parameters; any failure
detected in these tests is notified to the system host. The device will continue to operate in the
event that such functional failures are detected.
The functional tests are:
Check that the channel-measurement signals are within the defined range.
Confirm that data stored in the EEPROM is valid.
These tests are carried out as the particular functions are used. For example, the EEPROM is
checked when the device attempts to load data from EEPROM, and the channel signals are
checked when a measurement is carried out.
Note:
If a particular channel is unused, the threshold of that channel should be set to 0 to
prevent the incorrect reporting of the unused channel as being in an error state.
Guard Channel
Formed of One Key
Key Pad Formed
of Six Keys
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