
C508
Data Sheet
69
2000-08
Notes:
1)
Applicable to C508-4E only.
2)
Applicable to C508-4R only.
3)
Capacitive loading on ports 0 and 2 may cause spurious noise pulses to be superimposed on the
V
OL
of ALE
and port 3. The noise is due to external bus capacitance discharging into the port 0 and port 2 pins when these
pins make 1-to-0 transitions during bus operation. In the worst case (capacitive loading > 100 pF), the noise
pulse on ALE line may exceed 0.8 V. In such cases it may be desirable to qualify ALE with a Schmitt-trigger,
or use an address latch with a Schmitt-trigger strobe input.
4)
Capacitive loading on ports 0 and 2 may cause the
V
OH
on ALE and PSEN to momentarily fall below the
0.9
V
DD
specification when the address lines are stabilizing.
5)
I
PD
(power-down mode) is measured under following conditions:
EA = Port 0 =
V
SS
; RESET =
V
SS
; XTAL2 = N.C.; XTAL1 =
V
SS
;
V
AGND
=
V
SS
;
V
AREF
=
V
DD
; all other pins
are disconnected.
6)
I
DD
(active mode) is measured with:
XTAL1 driven with
t
R
,
t
F
= 5 ns,
V
IL
=
V
SS
+ 0.5 V,
V
IH
=
V
DD
– 0.5 V; XTAL2 = N.C.;
EA = Port 0 =
V
DD
; RESET =
V
DD
; all other pins are disconnected.
I
DD
would be slightly higher if the crystal
oscillator is used (approx. 1 mA).
7)
I
DD
(idle mode) is measured with all output pins disconnected and with all peripherals disabled;
XTAL1 driven with
t
R
,
t
F
= 5 ns,
V
IL
=
V
SS
+ 0.5 V,
V
IH
=
V
DD
– 0.5 V; XTAL2 = N.C.;
RESET = EA =
V
SS
; Port0 =
V
DD
; all other pins are disconnected.
8)
I
DD
(active mode with slow-down mode) is measured with all output pins disconnected and with all peripherals
disabled; XTAL1 driven with
t
R
,
t
F
= 5 ns,
V
IL
=
V
SS
+ 0.5 V,
V
IH
=
V
DD
– 0.5 V; XTAL2 = N.C.;
RESET = EA =
V
SS
; Port0 =
V
DD
; all other pins are disconnected; the microcontroller is put into slow-down
mode by software.
9)
I
DD
(idle mode with slow-down mode) is measured all output pins disconnected and with all peripherals
disabled; XTAL1 driven with
t
R
,
t
F
= 5 ns,
V
IL
=
V
SS
+ 0.5 V,
V
IH
=
V
DD
– 0.5 V; XTAL2 = N.C.;
RESET = EA =
V
SS
; Port0 =
V
DD
; all other pins are disconnected; the microcontroller is put into idle mode with
slow-down mode enabled by software.
10)
Overload conditions under operating conditions are exceeded, i.e. the voltage on any pin exceeds the specified
range (i.e.
V
OV
>
V
DD
+ 0.5 V or
V
OV
<
V
SS
– 0.5 V). The absolute sum of input currents on all port pins may
not exceed 50 mA. The supply voltage
V
DD
and
V
SS
must remain within the specified limits.
11)
Not 100% tested, guaranteed by design characterization
12)
The typical
I
DD
values are periodically measured at
T
A
= + 25
°
C but not 100% tested.
13)
The maximum
I
DD
values are measured under worst case conditions (
T
A
= 0
°
C or – 40
°
C and
V
DD
= 5.5 V).