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| 型號(hào)： | EV-ADF4106SD1Z |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 19/24頁 |
| 文件大?。?/td> | 0K |
| 描述： | BOARD EVAL FOR ADF4106SD1Z |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | * |
ADF4106
Data Sheet
Rev. E | Page 4 of 24
Parameter
B Version1
B Chips2 (typ)
Unit
Test Conditions/Comments
NOISE CHARACTERISTICS
Normalized Phase Noise Floor
(PNSYNTH)11
–223
dBc/Hz typ
PLL loop B/W = 500 kHz, measured at 100 kHz
offset
Normalized 1/f Noise (PN1_f)12
122
dBc/Hz typ
10 kHz offset; normalized to 1 GHz
Phase Noise Performance13
@ VCO output
900 MHz14
–92.5
92.5
dBc/Hz typ
@ 1 kHz offset and 200 kHz PFD frequency
5800 MHz15
76.5
dBc/Hz typ
@ 1 kHz offset and 200 kHz PFD frequency
5800 MHz16
83.5
dBc/Hz typ
@ 1 kHz offset and 1 MHz PFD frequency
Spurious Signals
900 MHz14
–90/–92
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD frequency
5800 MHz15
–65/–70
dBc typ
@ 200 kHz/400 kHz and 200 kHz PFD frequency
5800 MHz16
–70/–75
dBc typ
@ 1 MHz/2 MHz and 1 MHz PFD frequency
1 Operating temperature range (B Version) is –40°C to +85°C.
2 The B chip specifications are given as typical values.
3 This is the maximum operating frequency of the CMOS counters. The prescaler value should be chosen to ensure that the RF input is divided down to a frequency that
is less than this value.
4 AVDD = DVDD = 3 V.
5 AC coupling ensures AVDD/2 bias.
6 Guaranteed by design. Sample tested to ensure compliance.
7 TA = 25°C; AVDD = DVDD = 3 V; P = 16; RFIN = 900 MHz.
8 TA = 25°C; AVDD = DVDD = 3 V; P = 16; RFIN = 2.0 GHz.
9 TA = 25°C; AVDD = DVDD = 3 V; P = 32; RFIN = 6.0 GHz.
10 TA = 25°C; AVDD = DVDD = 3.3 V; R = 16383; A = 63; B = 891; P = 32; RFIN = 6.0 GHz.
11 The synthesizer phase noise floor is estimated by measuring the in-band phase noise at the output of the VCO and subtracting 20 log N (where N is the N divider
value) and 10 log FPFD. PNSYNTH = PNTOT 10 log FPFD 20 log N.
12 The PLL phase noise is composed of 1/f (flicker) noise plus the normalized PLL noise floor. The formula for calculating the 1/f noise contribution at an RF frequency, fRF,
and at a frequency offset, f, is given by PN = PN1_f + 10 log(10 kHz/f) + 20 log(fRF/1 GHz). Both the normalized phase noise floor and flicker noise are modeled in
ADIsimPLL.
13 The phase noise is measured with the EV-ADF4106SD1Z evaluation board and the Agilent E4440A Spectrum Analyzer. The spectrum analyzer provides the REFIN for
the synthesizer (fREFOUT = 10 MHz @ 0 dBm).
14 fREFIN = 10 MHz; fPFD = 200 kHz; Offset Frequency = 1 kHz; fRF = 900 MHz; N = 4500; Loop B/W = 20 kHz.
15 fREFIN = 10 MHz; fPFD = 200 kHz; Offset Frequency = 1 kHz; fRF = 5800 MHz; N = 29000; Loop B/W = 20 kHz.
16 fREFIN = 10 MHz; fPFD = 1 MHz; Offset Frequency = 1 kHz; fRF = 5800 MHz; N = 5800; Loop B/W = 100 kHz.
TIMING CHARACTERISITICS
AVDD = DVDD = 3 V ± 10%, AVDD ≤ VP ≤ 5.5 V, AGND = DGND = CPGND = 0 V, RSET = 5.1 kΩ, dBm referred to 50 Ω, TA = TMAX to TMIN,
unless otherwise noted.
Table 2.
Parameter
Limit1 (B Version)
Unit
Test Conditions/Comments
t1
10
ns min
DATA to CLOCK Setup Time
t2
10
ns min
DATA to CLOCK Hold Time
t3
25
ns min
CLOCK High Duration
t4
25
ns min
CLOCK Low Duration
t5
10
ns min
CLOCK to LE Setup Time
t6
20
ns min
LE Pulse Width
1 Operating temperature range (B Version) is –40°C to +85°C.
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