參數(shù)資料
型號(hào): EVAL-AD7327CBZ
廠商: Analog Devices Inc
文件頁(yè)數(shù): 9/37頁(yè)
文件大?。?/td> 0K
描述: BOARD EVALUATION FOR AD7327
標(biāo)準(zhǔn)包裝: 1
系列: iCMOS®
ADC 的數(shù)量: 1
位數(shù): 12
采樣率(每秒): 500k
數(shù)據(jù)接口: 串行
輸入范圍: ±10 V
在以下條件下的電源(標(biāo)準(zhǔn)): 17mW @ 500kSPS
工作溫度: -40°C ~ 85°C
已用 IC / 零件: AD7327
已供物品:
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AD7327
Rev. B | Page 16 of 36
THEORY OF OPERATION
CIRCUIT INFORMATION
The AD7327 is a fast, 8-channel, 12-bit plus sign, bipolar input,
serial ADC. The AD7327 can accept bipolar input ranges that
include ±10 V, ±5 V, and ±2.5 V; it can also accept a 0 V to +10 V
unipolar input range. A different analog input range can be
programmed on each analog input channel via the on-chip
registers. The AD7327 has a high speed serial interface that can
operate at throughput rates up to 500 kSPS.
The AD7327 requires VDD and VSS dual supplies for the high
voltage analog input structures. These supplies must be equal
to or greater than the analog input range. See Table 6 for the
requirements of these supplies for each analog input range. The
AD7327 requires a low voltage 2.7 V to 5.25 V VCC supply to
power the ADC core.
Table 6. Reference and Supply Requirements for Each
Analog Input Range
Selected
Analog Input
Range (V)
Reference
Voltage (V)
Full-Scale
Input
Range (V)
AVCC(V)
Minimum
VDD/VSS (V)1
±10
2.5
±10
3/5
±10
3.0
±12
3/5
±12
± 5
2.5
±5
3/5
±5
3.0
±6
3/5
±6
±2.5
2.5
±2.5
3/5
±5
3.0
±3
3/5
±5
0 to +10
2.5
0 to +10
3/5
+10/AGND
3.0
0 to +12
3/5
+12/AGND
1
Guaranteed performance for VDD = 12 V to 16.5 V and VSS = 12 V to 16.5 V.
The performance specifications are guaranteed for VDD = 12 V
to 16.5 V and VSS = 12 V to 16.5 V. With VDD and VSS supplies
outside this range, the AD7327 is fully functional but performance
is not guaranteed. It may be necessary to decrease the throughput
rate when the AD7327 is configured with the minimum VDD
and VSS supplies to meet the performance specifications (see the
the change in THD as the VDD and VSS supplies are reduced. For
ac performance at the maximum throughput rate, the THD
degrades slightly as VDD and VSS are reduced. It might, therefore,
be necessary to reduce the throughput rate when using minimum
VDD and VSS supplies so that there is less degradation of THD
and the specified performance can be maintained. The
degradation is due to an increase in the on resistance of the
input multiplexer when the VDD and VSS supplies are reduced.
Figure 18 and Figure 19 show the change in INL and DNL as
the VDD and VSS voltages are varied. For dc performance when
operating at the maximum throughput rate, as the VDD and VSS
supply voltages are reduced, the typical INL and DNL error
remains constant.
The analog inputs can be configured as eight single-ended
inputs, four true differential inputs, four pseudo differential
inputs, or seven pseudo differential inputs. Selection can be
made by programming the mode bits, Mode 0 and Mode 1, in
the control register.
The serial clock input accesses data from the part and provides
the clock source for the successive approximation ADC. The
AD7327 has an on-chip 2.5 V reference; however, the AD7327
can also work with an external reference. On power-up, the
external reference operation is the default option. If the internal
reference is the preferred option, the user must write to the
reference bit in the control register to select the internal reference
operation.
The AD7327 also features power-down options to allow power
savings between conversions. The power-down modes are selected
by programming the on-chip control register, as described in
CONVERTER OPERATION
The AD7327 is a successive approximation ADC built around
two capacitive DACs. Figure 23 and Figure 24 show simplified
schematics of the ADC in single-ended mode during the
acquisition and conversion phases, respectively. Figure 25 and
Figure 26 show simplified schematics of the ADC in differential
mode during acquisition and conversion phases, respectively.
The ADC is composed of control logic, a SAR, and capacitive
DACs. In Figure 23 (the acquisition phase), SW2 is closed and
SW1 is in Position A, the comparator is held in a balanced
condition, and the sampling capacitor array acquires the signal
on the input.
CAPACITIVE
DAC
CONTROL
LOGIC
COMPARATOR
AGND
SW2
SW1
A
B
CS
VIN0
05401-
017
Figure 23. ADC Acquisition Phase (Single-Ended)
When the ADC starts a conversion (Figure 24), SW2 opens and
SW1 moves to Position B, causing the comparator to become
unbalanced. The control logic and the charge redistribution
DAC are used to add and subtract fixed amounts of charge from
the capacitive DAC to bring the comparator back into a balanced
condition. When the comparator is rebalanced, the conversion
is complete. The control logic generates the ADC output code.
CAPACITIVE
DAC
CONTROL
LOGIC
COMPARATOR
AGND
SW2
SW1
A
B
CS
VIN0
05401-
018
Figure 24. ADC Conversion Phase (Single-Ended)
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