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鍙冩暩(sh霉)璩囨枡
| 鍨嬭櫉(h脿o)锛� | EVAL-AD7366CBZ |
| 寤犲晢锛� | Analog Devices Inc |
| 鏂囦欢闋佹暩(sh霉)锛� | 29/29闋� |
| 鏂囦欢澶у皬锛� | 0K |
| 鎻忚堪锛� | BOARD EVALUATION FOR AD7366 |
| 妯�(bi膩o)婧�(zh菙n)鍖呰锛� | 1 |
| 绯诲垪锛� | iCMOS® |
| ADC 鐨勬暩(sh霉)閲忥細 | 2 |
| 浣嶆暩(sh霉)锛� | 12 |
| 閲囨ǎ鐜囷紙姣忕锛夛細 | 1M |
| 鏁�(sh霉)鎿�(j霉)鎺ュ彛锛� | 涓茶 |
| 杓稿叆鑼冨湇锛� | ±10 V |
| 鍦ㄤ互涓嬫浠朵笅鐨勯浕婧愶紙妯�(bi膩o)婧�(zh菙n)锛夛細 | 70mW @ 1MSPS |
| 宸ヤ綔婧害锛� | -40°C ~ 85°C |
| 宸茬敤 IC / 闆朵欢锛� | AD7366 |
| 宸蹭緵鐗╁搧锛� | 鏉� |
| 鐩搁棞(gu膩n)鐢�(ch菐n)鍝侊細 | AD7366BRUZ-5-ND - IC ADC 12BIT DUAL 500KSPS 24-TSS AD7366BRUZ-5500RL7-ND - IC ADC 12BIT DUAL BIPO 24-TSSOP AD7366BRUZ-5-RL7-ND - IC ADC 12BIT DUAL BIPO 24-TSSOP AD7366BRUZ-ND - IC ADC 12BIT SAR 1MSPS 24TSSOP AD7366BRUZ-RL7-ND - IC ADC 12BIT SAR 1MSPS 24TSSOP AD7366BRUZ-500RL7-ND - IC ADC 12BIT SAR 1MSPS 24TSSOP |
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AD7366/AD7367
Rev. D | Page 8 of 28
ABSOLUTE MAXIMUM RATINGS
Table 5.
Parameter
Rating
V
DD to AGND, DGND
0.3 V to +16.5 V
V
SS to AGND, DGND
16.5 V to +0.3 V
V
DRIVE to DGND
0.3 V to DV
CC
V
DD to AVCC
(V
CC 0.3 V) to +16.5 V
AV
CC to AGND, DGND
0.3 V to +7 V
DV
CC to AVCC
0.3 V to +0.3 V
DV
CC to DGND
0.3 V to +7 V
V
DRIVE to AGND
0.3 V to DV
CC
AGND to DGND
0.3 V to +0.3 V
Analog Input Voltage to AGND
V
SS 0.3 V to VDD + 0.3 V
Digital Input Voltage to DGND
0.3 V to V
DRIVE + 0.3 V
Digital Output Voltage to GND
0.3 V to V
DRIVE + 0.3 V
D
CAPA, DCAPB Input to AGND
0.3 V to AV
CC + 0.3 V
Input Current to Any Pin Except
Supplies1
卤10 mA
Operating Temperature Range
40掳C to +85掳C
Storage Temperature Range
65掳C to +150掳C
Junction Temperature
150掳C
TSSOP Package
胃
JA Thermal Impedance
128掳C/W
胃
JC Thermal Impedance
42掳C/W
Pb-Free Temperature, Soldering Reflow
260掳C
ESD
1.5 kV
1 Transient currents of up to 100 mA will not cause latch-up.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
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