8732AY-01
www.idt.com
REV. E MAY 2, 2013
5
ICS8732-01
LOW VOLTAGE, LOW SKEW
3.3V LVPECL CLOCK GENERATOR
TABLE 5A. POWER SUPPLY DC CHARACTERISTICS, V
CC = VCCA = VCCO = 3.3V±5%, T
A
= 0°C TO 70°C
l
o
b
m
y
Sr
e
t
e
m
a
r
a
Ps
n
o
i
t
i
d
n
o
C
t
s
e
Tm
u
m
i
n
i
Ml
a
c
i
p
y
Tm
u
m
i
x
a
Ms
t
i
n
U
V
C
e
g
a
t
l
o
V
y
l
p
u
S
e
r
o
C
5
3
1
.
33
.
35
6
4
.
3V
V
A
C
e
g
a
t
l
o
V
y
l
p
u
S
g
o
l
a
n
A
5
3
1
.
33
.
35
6
4
.
3V
V
O
C
e
g
a
t
l
o
V
y
l
p
u
S
t
u
p
t
u
O
5
3
1
.
33
.
35
6
4
.
3V
I
C
t
n
e
r
u
C
y
l
p
u
S
r
e
w
o
P
5
6
1A
m
I
A
C
t
n
e
r
u
C
y
l
p
u
S
g
o
l
a
n
A
5
1A
m
TABLE 5B. LVCMOS/LVTTL DC CHARACTERISTICS, V
CC = VCCA = VCCO = 3.3V±5%, T
A
= 0°C TO 70°C
l
o
b
m
y
Sr
e
t
e
m
a
r
a
Ps
n
o
i
t
i
d
n
o
C
t
s
e
Tm
u
m
i
n
i
Ml
a
c
i
p
y
Tm
u
m
i
x
a
Ms
t
i
n
U
V
H
I
e
g
a
t
l
o
V
h
g
i
H
t
u
p
n
I
1
K
L
C2
V
C
3
.
0
+V
,
L
E
S
_
L
P
,
L
E
S
_
K
L
C
,
x
B
L
E
S
_
V
I
D
,
x
A
L
E
S
_
V
I
D
R
M
,
x
L
E
S
_
V
I
D
B
F
2V
C
3
.
0
+V
V
L
I
e
g
a
t
l
o
V
w
o
L
t
u
p
n
I
1
K
L
C3
.
0
-3
.
1V
,
L
E
S
_
L
P
,
L
E
S
_
K
L
C
,
x
B
L
E
S
_
V
I
D
,
x
A
L
E
S
_
V
I
D
R
M
,
x
L
E
S
_
V
I
D
B
F
3
.
0
-8
.
0V
I
H
I
t
n
e
r
u
C
h
g
i
H
t
u
p
n
I
1
K
L
C
,
R
M
,
L
E
S
_
K
L
C
,
x
B
L
E
S
_
V
I
D
,
x
A
L
E
S
_
V
I
D
x
L
E
S
_
V
I
D
B
F
V
C
V
=
N
I
V
5
6
4
.
3
=0
5
1A
L
E
S
_
L
PV
C
V
=
N
I
V
5
6
4
.
3
=5
A
I
L
I
t
n
e
r
u
C
w
o
L
t
u
p
n
I
1
K
L
C
,
R
M
,
L
E
S
_
K
L
C
,
x
B
L
E
S
_
V
I
D
,
x
A
L
E
S
_
V
I
D
x
L
E
S
_
V
I
D
B
F
V
C
,
V
5
6
4
.
3
=
V
N
I
V
0
=
5
-A
L
E
S
_
L
P
V
C
,
V
5
6
4
.
3
=
V
N
I
V
0
=
0
5
1
-A
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, V
CC
4.6V
Inputs, V
I
-0.5V to V
CC + 0.5 V
Outputs, I
O
Continuous Current
50mA
Surge Current
100mA
Package Thermal Impedance,
θ
JA
42.3°C/W (0 lfpm)
Storage Temperature, T
STG
-65°C to 150°C
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device.These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions be-
yond those listed in the
DC Characteristics or AC Character-
istics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.