參數(shù)資料
型號(hào)： IDT5T9820NLGI8
廠商： INTEGRATED DEVICE TECHNOLOGY INC
元件分類： 時(shí)鐘及定時(shí)
英文描述： 5T SERIES, PLL BASED CLOCK DRIVER, 10 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), QCC68
封裝： GREEN, PLASTIC, VFQFPN-68
文件頁(yè)數(shù)： 9/36頁(yè)
文件大小： 275K
代理商： IDT5T9820NLGI8
17
INDUSTRIALTEMPERATURERANGE
IDT5T9820
EEPROM PROGRAMMABLE 2.5V ZERO DELAY PLL CLOCK DRIVER
SINGLE-ENDED INPUT AC TEST CONDITIONS FOR 1.8V LVTTL
Symbol
Parameter
Value
Units
VIH
Input HIGH Voltage(1)
VDDI
V
VIL
InputLOWVoltage
0V
VTHI
InputTimingMeasurementReferenceLevel(2)
VDDI/2
mV
tR, tF
InputSignalEdgeRate(3)
2
V/ns
NOTES:
1. VDDI is the nominal 1.8V supply (1.8V ± 0.15V) of the part or source driving the input.
2. A nominal 900mV timing measurement reference level is specified to allow constant, repeatable results in an automatic test equipment (ATE) environment.
3. The input signal edge rate of 2V/ns or greater is to be maintained in the 10% to 90% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR 1.8V LVTTL
Symbol
Parameter
Value
Units
VDIF
Input Signal Swing(1)
VDDI
V
VX
DifferentialInputSignalCrossingPoint(2)
VDDI/2
mV
VTHI
InputTimingMeasurementReferenceLevel(3)
CrossingPoint
V
tR, tF
InputSignalEdgeRate(4)
1.8
V/ns
NOTES:
1. VDDI is the nominal 1.8V supply (1.8V ± 0.15V) of the part or source driving the input. A nominal 1.8V peak-to-peak input pulse level is specified to allow consistent, repeatable
results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC) specification under actual use conditions.
2. A nominal 900mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification
under actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 1.8V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
POWER SUPPLY CHARACTERISTICS FOR 1.8V LVTTL OUTPUTS(1)
Symbol
Parameter
Test Conditions(2)
Typ.
Max
Unit
IDDQ
Quiescent VDD Power Supply Current(3)
VDDQN = Max., REF = LOW, PD = HIGH, nSOE = LOW,
112
150
mA
PLL_EN = HIGH, Outputs enabled, All outputs unloaded
IDDQQ
Quiescent VDDQN Power Supply Current(3)
VDDQN = Max., REF = LOW, PD = HIGH, nSOE = LOW,
3
75
A
PLL_EN = HIGH, Outputs enabled, All outputs unloaded
IDDPD
Power Down Current
VDD = Max., PD = LOW, nSOE = LOW, PLL_EN = HIGH
0.7
3
mA
IDDD
Dynamic VDD Power Supply
VDD = Max., VDDQN = Max., CL = 0pF
18
30
A/MHz
CurrentperOutput
IDDDQ
Dynamic VDDQN Power Supply
VDD = Max., VDDQN = Max., CL = 0pF
19
30
A/MHz
CurrentperOutput
ITOT
Total Power VDD Supply Current(4,5)
VDDQN = 1.8V., FVCO = 100MHz, CL = 15pF
275
400
mA
VDDQN = 1.8V., FVCO = 250MHz, CL = 15pF
310
450
ITOTQ
Total Power VDDQN Supply Current(4,5)
VDDQN = 1.8V., FVCO = 100MHz, CL = 15pF
135
200
mA
VDDQN = 1.8V., FVCO = 250MHz, CL = 15pF
200
300
NOTES:
1. These power consumption characteristics are for all the valid input interfaces and cover the worst case input and output interface combinations.
2. The termination resistors are excluded from these measurements.
3. If the differential input interface is used, the true input is held LOW and the complementary input is held HIGH.
4. Bit 60 = 1.
5. All outputs are at the same interface level.
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