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參數(shù)資料
| 型號： | KIT33975AEWEVBE |
| 廠商： | Freescale Semiconductor |
| 文件頁數(shù)： | 15/32頁 |
| 文件大?。?/td> | 0K |
| 描述： | KIT EVALUATION FOR MC33975 |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 主要目的： | 接口，開關(guān)探測 |
| 嵌入式： | 否 |
| 已用 IC / 零件： | MC33975 |
| 主要屬性： | 8 可編程輸入（電池開關(guān)或接地開關(guān)） |
| 次要屬性： | 14 開關(guān)至接地輸入 |
| 已供物品： | 板，CD |
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Analog Integrated Circuit Device Data
22
Freescale Semiconductor
33975
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
The interrupt timer is used as a periodic wake-up timer. When
the timer expires, an interrupt is generated and the device
enters Normal mode.
Note: The interrupt timer in the 33975 device may be
disabled by programming the interrupt bits to logic [1 1 1].
Table 19 shows the programmable settings of the Interrupt
timer.
The scan timer sets the polling period between input switch
reads in Sleep mode. The period is set in the sleep command
and may be set to 000 (no period) to 111 (64 ms). In Sleep
mode when the scan timer expires, inputs will behave as
programmed prior to sleep command. The 33975 will wake
up for approximately 125
s and read the switch inputs. At
the end of the 125
s, the input switch states are compared
with the switch state prior to sleep command. When switch
state changes are detected, an interrupt (when enabled; refer
to wake-up/interrupt command description on page 17) is
generated and the device enters Normal mode. Without
switch state changes, the 33975 will reset the scan timer,
inputs become tri-state, and the Sleep mode continues until
the scan timer expires again.
Table 20 shows the programmable settings of the Scan
timer.
Note: The interrupt and scan timers are disabled in the
Normal Mode.
Figure 5, page 11, is a graphical description of how the
33975 device exits Sleep mode and enters Normal mode.
Notice that the device will exit Sleep mode when the interrupt
timer expires or when a switch change of state occurs. The
falling edge of INT triggers the MCU to wake from Sleep state.
Figure 12 illustrates the current consumed during Sleep
mode. During the 125
s, the device is fully active and switch
states are read. The quiescent current is calculated by
integrating the normal running current over scan period plus
approximately 60
A.
Figure 12. Sleep Current Waveform
TEMPERATURE MONITOR
With multiple switch inputs closed and the device
programmed with the wetting current timers disabled,
considerable power will be dissipated by the IC. For this
reason temperature monitoring has been implemented. The
temperature monitor is active in the Normal mode only. When
the IC temperature is above the thermal limit, the temperature
monitor will do all of the following:
Generate an interrupt.
Force all wetting current sources to revert to 2.0 mA/
4.0 mA sustain currents
Maintain the 2.0 mA/4.0 mA sustain currents and all
other functionality.
Set the thermal flag bit in the SPI output register.
The thermal flag bit in the SPI word will be cleared on the
rising edge of CS provided the die temperature has cooled
below the thermal limit. When die temperature has cooled
below thermal limit, the device will resume previously
programmed settings.
Table 19. Interrupt Timer
Bits 543
Interrupt Period
000
32 ms
001
64 ms
010
128 ms
011
256 ms
100
512 ms
101
1.024 s
110
2.048 s
111
No interrupt wake-up
Table 20. Scan Timer
Bits 210
Scan Period
000
No Scan
001
1.0 ms
010
2.0 ms
011
4.0 ms
100
8.0 ms
101
16 ms
110
32 ms
111
64 ms
Inputs active for 125 us
out of 32 ms
I=V/R or 0.270V/100ohm = 2.7mA
I=V/R or 6mV/100ohm = 60 uA
Inputs active for 125 us
out of 32 ms
I=V/R or 0.270V/100ohm = 2.7mA
I=V/R or 6mV/100ohm = 60 uA
Inputs active for 125 us
out of 32 ms
I=V/R or 0.270V/100ohm = 2.7mA
I=V/R or 6mV/100ohm = 60 uA
I=V/R or 0.270V/100
=2.7mA
Inputs active for
125
s out of 32ms
I=V/R or
6.0mV/100
=60A
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