參數(shù)資料
型號(hào): LM2575
廠商: ON SEMICONDUCTOR
英文描述: 1.0 A, Adjustable Output Voltage, Step-Down Switching Regulator(1.0A,可調(diào)輸出電壓,降壓型開關(guān)穩(wěn)壓器)
中文描述: 1.0甲,可調(diào)輸出電壓,降壓型開關(guān)穩(wěn)壓器(1.0安培,可調(diào)輸出電壓,降壓型開關(guān)穩(wěn)壓器)
文件頁數(shù): 2/28頁
文件大?。?/td> 363K
代理商: LM2575
LM2575
http://onsemi.com
2
Figure 1. Block Diagram and Typical Application
7.0 V 40 V
Unregulated
DC Input
L1
330 H
GND
+V
in
1
C
in
100 F
3
ON/OFF
5
Output
2
Feedback
4
D1
1N5819
C
out
330 F
Typical Application
(Fixed Output Voltage Versions)
Representative Block Diagram and Typical Application
Unregulated
DC Input
+V
in
1
C
out
Feedback
4
C
in
L1
D1
R2
R1
1.0 k
Output
2
GND
3
ON/OFF
5
Reset
Latch
Thermal
Shutdown
52 kHz
Oscillator
1.235 V
BandGap
Reference
Freq
Shift
18 kHz
Comparator
Fixed Gain
Error Amplifier
Current
Limit
Driver
1.0 Amp
Switch
ON/OFF
3.1 V Internal
Regulator
Regulated
Output
V
out
Load
Output
Voltage Versions
3.3 V
5.0 V
12 V
15 V
R2
( )
1.7 k
3.1 k
8.84 k
11.3 k
For adjustable version
R1 = open, R2 = 0
LM2575
5.0 V Regulated
Output 1.0 A Load
This device contains 162 active transistors.
ABSOLUTE MAXIMUM RATINGS
(Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.)
Rating
Symbol
Value
Unit
Maximum Supply Voltage
V
in
45
V
ON/OFF Pin Input Voltage
0.3 V
V
+V
in
V
Output Voltage to Ground (SteadyState)
1.0
V
Power Dissipation
Case 314B and 314D (TO220, 5Lead)
Thermal Resistance, JunctiontoAmbient
Thermal Resistance, JunctiontoCase
Case 936A (D
2
PAK)
Thermal Resistance, JunctiontoAmbient (Figure 34)
Thermal Resistance, JunctiontoCase
P
D
R
JA
R
JC
P
D
R
JA
R
JC
T
stg
Internally Limited
65
5.0
Internally Limited
70
5.0
W
°
C/W
°
C/W
W
°
C/W
°
C/W
Storage Temperature Range
65 to +150
°
C
Minimum ESD Rating (Human Body Model: C = 100 pF, R = 1.5 k )
3.0
kV
Lead Temperature (Soldering, 10 s)
260
°
C
Maximum Junction Temperature
T
J
150
°
C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
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