參數(shù)資料
型號: M28C16-20NS6
廠商: 意法半導(dǎo)體
英文描述: 16 Kbit 2Kb x8 Parallel EEPROM
中文描述: 16千位2KB的x8并行的EEPROM
文件頁數(shù): 5/19頁
文件大?。?/td> 134K
代理商: M28C16-20NS6
Symbol
Parameter
Test Condition
Min
Max
Unit
C
IN
Input Capacitance
V
IN
= 0V
6
pF
C
OUT
Output Capacitance
V
OUT
= 0V
12
pF
Note:
1. Sampled only,not 100% tested.
Table5. Capacitance
(1)
(T
A
= 25
°
C, f = 1 MHz )
Symbol
Parameter
Test Condition
Min
Max
Unit
I
LI
Input Leakage Current
0V
V
IN
V
CC
10
μ
A
I
LO
Output Leakage Current
0V
V
IN
V
CC
10
μ
A
I
CC(1)
Supply Current (TTLand CMOS inputs)
E = V
IL
, G = V
IL
, f = 5MHz
25
mA
I
CC1
(1)
Supply Current (Standby) TTL
E = V
IH
1
mA
I
CC2
(1)
Supply Current (Standby) CMOS
E > V
CC
– 0.3V
50
μ
A
V
IL
Input Low Voltage
–0.3
0.8
V
V
IH
Input High Voltage
2
V
CC
+ 0.5
V
V
OL
Output Low Voltage
I
OL
= 2.1 mA
0.4
V
V
OH
Output High Voltage
I
OH
= –400
μ
A
2.4
V
Note:
1. All I/O’sopen circuit.
Table6. Read Mode DC Characteristicsfor M28C16Aand M28C17A
(T
A
= –40 to 85
°
C, V
CC
= 4.5Vto 5.5V)
Input Rise and Fall Times
20ns
Input Pulse Voltages
0.4V to 2.4V
Input and Output TimingRef. Voltages
0.8V to 2.0V
Note that Output Hi-Z is defined as the point where data is no longer driven.
Table4. AC MeasurementConditions
AI02101B
4.5V to 5.5V Operating Voltage
2.7V to 3.6V Operating Voltage
VCC– 0.3V
0V
0.5 VCC
2.4V
0.4V
2.0V
0.8V
Figure 5. AC TestingInput Output Waveforms
AI02114
OUT
CL= 30pF
CLincludes JIG capacitance
IOL
DEVICE
UNDER
TEST
IOH
VCC
Figure6. AC TestingEquivalent LoadCircuit
5/19
M28C16A, M28C17A
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