參數(shù)資料
型號: M48Z02
廠商: 意法半導(dǎo)體
英文描述: 16 Kbit 2Kb x 8 ZEROPOWER SRAM
中文描述: 16千位2KB的SRAM的× 8 ZEROPOWER
文件頁數(shù): 3/12頁
文件大?。?/td> 85K
代理商: M48Z02
AI01019
5V
OUT
CL = 100pF
CL includes JIG capacitance
1.8k
DEVICE
UNDER
TEST
1k
Figure 4. AC Testing Load Circuit
Input Rise and Fall Times
5ns
Input Pulse Voltages
0V to 3V
Input and Output Timing Ref. Voltages
1.5V
Note that Output Hi-Z is defined as the point where data is no
longer driven.
Table 4. AC Measurement Conditions
AI01255
LITHIUM
CELL
VPFD
VCC
VSS
VOLTAGE SENSE
AND
SWITCHING
CIRCUITRY
2K x 8
SRAM ARRAY
A0-A10
DQ0-DQ7
E
W
G
POWER
Figure 3. Block Diagram
READ MODE
The M48Z02/12 is in the Read Mode whenever W
(Write Enable) is high and E (Chip Enable) is low.
The device architecture allows ripple-through ac-
cess of data from eight of 16,384 locations in the
static storage array. Thus, the unique address
specified by the 11 Address Inputs defines which
one of the 2,048 bytes of data is to be accessed.
Valid data will be available at the Data I/O pins
within Address Access time (t
AVQV
) after the last
address input signal is stable, providing that the E
and G access times are also satisfied. If the E and
G access times are not met, valid data will be
available after the latter of the Chip Enable Access
time (t
ELQV
) or Output Enable Access time (t
GLQV
).
The state of the eight three-state Data I/O signals
is controlled by E and G. If the outputs are activated
before t
AVQV
, the data lines will be driven to an
indeterminate state until t
AVQV
. If the Address In-
puts are changed while E and G remain active,
output data will remain valid for Output Data Hold
time (t
AXQX
) but will go indeterminate until the next
Address Access.
3/12
M48Z02, M48Z12
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