參數(shù)資料
型號: M616Z08-20MH3TR
廠商: 意法半導(dǎo)體
英文描述: CAT5E PATCH CORD 100 FOOT YELLOW
中文描述: 128千位8千位× 16的SRAM帶有輸出使能
文件頁數(shù): 10/14頁
文件大?。?/td> 95K
代理商: M616Z08-20MH3TR
M616Z08
10/14
“Operational” Mode
The M616Z08 has a Chip Enable power down fea-
ture which invokes an automatic standby mode
whenever Chip Enable is de-asserted (CE = High).
An Output Enable (OE) signal provides a high
speed tri-state control, allowing fast READ/WRITE
cycles to be achieved with the common I/O data
bus. Operational modes are determined by device
control inputs WE0 or WE1 and CE as summa-
rized in “Operating Modes” (see Table 8 and Table
9).
Noise Immunity
When designing with high speed memory, proper
power trace layout and capacitive decoupling
must be maintained to ensure proper system oper-
ation. Power and ground line inductance should be
reduced by providing separate power planes. The
impedance of the decoupling path from the power
pin through the decoupling capacitor should also
be kept to a minimum. Small decoupling capaci-
tors (10nF) should be located as close to the de-
vice pins as possible to limit the high frequency
noise. Larger capacitor values (10uF and 1uF) are
recommended to reduce low frequency noise and
should be placed next to the power entry point of
the board. Proper line termination should also be
employed to minimize signal reflection.
See Motorola Semiconductor Application Note
AN2127/D for additional Electromagnetic Compat-
ibility (EMC) system design guidelines.
Table 8. WE(0,1) States during Access
Table 9. Operating Modes
Note: 1. X = '1' or '0'
WRITE Enable
Used during 16-bit Port Access
WE0
WRITE Enable for DQ (0-7)
WE1
WRITE Enable for DQ (8-15)
Operation
CE
OE
WE0
WE1
DQ0–DQ7
DQ8–15
Deselect
V
IH
X
(1)
X
(1)
X
(1)
Hi-Z
Hi-Z
Word WRITE
V
IL
V
IH
V
IL
V
IL
Hi-Z
Hi-Z
Byte 0 WRITE
V
IL
V
IH
V
IL
V
IH
Hi-Z
Hi-Z
Byte 1 WRITE
V
IL
V
IH
V
IH
V
IL
Hi-Z
Hi-Z
Byte 0 WRITE, Byte 1 READ
V
IL
V
IL
V
IL
V
IH
Hi-Z
Data
Byte 1 WRITE, Byte 0 READ
V
IL
V
IL
V
IH
V
IL
Data
Hi-Z
Word READ
V
IL
V
IL
V
IH
V
IH
Data
Data
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