參數(shù)資料
型號: MB81V4405C-70
廠商: Fujitsu Limited
英文描述: CMOS 1M ×4 BIT Hyper Page Mode Dynamic RAM(CMOS 1M ×4 位超級頁面存取模式動態(tài)RAM)
中文描述: 的CMOS 100萬× 4位超頁模式動態(tài)RAM的CMOS(100萬× 4位超級頁面存取模式動態(tài)內(nèi)存)
文件頁數(shù): 5/30頁
文件大?。?/td> 348K
代理商: MB81V4405C-70
5
MB81V4405C-60/MB81V4405C-70
I
RECOMMENDED OPERATING CONDITIONS
* :Undershoots of up to –2.0 volts with a pulse width not exceeding 20 ns are acceptable.
I
ADDRESS INPUTS
Twenty input bits are required to decode any four of 4,194,304 cell addresses in the memory matrix. Since only ten
address bits are available, the column and row inputs are separately strobed by CAS and RAS as shown in Figure
5. First, ten row address bits are input on pins A
0
-through-A
ten column address bits are input and latched with the column address strobe (CAS). Both row and column ad-
dresses must be stable on or before the falling edge of CAS and RAS, respectively. The address latches are of the
flow-through type; thus, address information appearing after t
address.
WRITE ENABLE
The read or write mode is determined by the logic state of WE. When WE is active Low, a write cycle is initiated;
when WE is High, a read cycle is selected. During the read mode, input data is ignored.
DATA INPUT
Input data is written into memory in either of three basic ways—an early write cycle, an OE (delayed) write cycle,
and a read-modify-write cycle. The falling edge of WE or CAS, whichever is later, serves as the input data-latch
strobe. In an early write cycle, the input data (DQ
1
-DQ
4
) is strobed by CAS and the setup/hold times are referenced
to CAS because WE goes Low before CAS. In a delayed write or a read-modify-write cycle, WE goes Low after
CAS; thus, input data is strobed by WE and all setup/hold times are referenced to the write-enable signal.
DATA OUTPUT
The three-state buffers are LVTTL compatible with a fanout of one TTL loads. Polarity of the output data is identical
to that of the input; the output buffers remain in the high-impedance state until the column address strobe goes
Low. When a read or read-modify-write cycle is executed, valid outputs and High-Z state are obtained under the
following conditions:
t
RAC
:
from the falling edge of RAS when t
RCD
(max.) is satisfied.
t
CAC
:
from the falling edge of CAS when t
RCD
is greater than t
t
AA
:
from column address input when t
RAD
is greater than t
t
OEA
:
from the falling edge of OE when OE is brought Low after t
t
OEZ
:
from OE inactive.
t
OFF
:
from CAS inactive while RAS inactive.
t
OFR
:
from RAS inactive while CAS inactive.
t
WEZ
:
from WE active while CAS inactive.
The data remains valid after either OE is inactive, or both RAS and CAS are inactive, or CAS is reactived. When
an early write is executed, the output buffers remain in a high-impedance state during the entire cycle.
FUNCTIONAL OPERATION
9
and latched with the row address strobe (RAS) then,
RAH
(min.) + t
T
is automatically treated as the column
RCD
(max.), and t
, t
(max.).
RAD
RCD
(max.) is satisfied.
.
RAC
CAC
, or t
AA
Parameter
Notes
Symbol
Min.
Typ.
Max.
Unit
Ambient
Operating Temp.
Supply Voltage
V
CC
3.0
3.3
3.6
V
0
°
C to +70
°
C
V
SS
0
0
0
Input High Voltage, all inputs
V
IH
2.0
V
CC
+0.3
V
Input Low Voltage, all inputs*
V
IL
–0.3
0.8
V
1
1
1
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