- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄69030 > MC9S08LL16CLF (FREESCALE SEMICONDUCTOR INC) 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, PQFP48 PDF資料下載
參數(shù)資料
| 型號(hào)： | MC9S08LL16CLF |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, PQFP48 |
| 封裝： | ROHS COMPLIANT, LQFP-48 |
| 文件頁數(shù)： | 4/44頁 |
| 文件大?。?/td> | 951K |
| 代理商： | MC9S08LL16CLF |
第1頁第2頁第3頁當(dāng)前第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁第35頁第36頁第37頁第38頁第39頁第40頁第41頁第42頁第43頁第44頁
MC9S08LL16 Series MCU Data Sheet, Rev. 6
Electrical Characteristics
Freescale Semiconductor
12
where K is a constant pertaining to the particular part. K can be determined from equation 3 by measuring
PD (at equilibrium) for a known TA. Using this value of K, the values of PD and TJ can be obtained by
3.5
ESD Protection and Latch-Up Immunity
Although damage from electrostatic discharge (ESD) is much less common on these devices than on early
CMOS circuits, normal handling precautions should be taken to avoid exposure to static discharge.
Qualification tests are performed to ensure that these devices can withstand exposure to reasonable levels
of static without suffering any permanent damage.
All ESD testing is in conformity with AEC-Q100 Stress Test Qualification for Automotive Grade
Integrated Circuits. During the device qualification, ESD stresses were performed for the human body
model (HBM), the machine model (MM) and the charge device model (CDM).
A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless instructed otherwise in the device
specification.
Table 6. ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human
Body Model
Series resistance
R1
1500
Storage capacitance
C
100
pF
Number of pulses per pin
—
3
Charge
Device
Model
Series resistance
R1
0
Storage capacitance
C
200
pF
Number of pulses per pin
—
3
Latch-up
Minimum input voltage limit
–2.5
V
Maximum input voltage limit
7.5
V
Table 7. ESD and Latch-Up Protection Characteristics
No.
Rating1
1 Parameter is achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted.
Symbol
Min
Max
Unit
1
Human body model (HBM)
VHBM
2000
—
V
2
Charge device model (CDM)
VCDM
500
—
V
3
Latch-up current at TA = 85CILAT
100
—
mA
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| MC9S08LL16CGT | 8-BIT, FLASH, 20 MHz, MICROCONTROLLER, QCC48 |
| MC9S08LL64CLK | 8-BIT, FLASH, 40 MHz, MICROCONTROLLER, PQFP80 |
| MC9S08MM128VLH | 8-BIT, FLASH, 48 MHz, MICROCONTROLLER, PQFP64 |
| MC9S08MM128VMB | 8-BIT, FLASH, 48 MHz, MICROCONTROLLER, PBGA81 |
| MC9S08MM32AVLH | 8-BIT, FLASH, 48 MHz, MICROCONTROLLER, PQFP64 |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| MC9S08LL16CLF | 制造商:Freescale Semiconductor 功能描述:IC 8BIT MCU HCS08 20MHZ LQFP-48 |
| MC9S08LL16CLFR | 制造商:Freescale Semiconductor 功能描述:8-BIT HCS08 CISC 16KB FLASH 2.5V/3.3V 48-PIN LQFP T/R - Tape and Reel |
| MC9S08LL16CLH | 功能描述:8位微控制器 -MCU 8BIT 16KFLASH 2KRAM RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時(shí)鐘頻率:50 MHz 程序存儲(chǔ)器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT |
| MC9S08LL36 | 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Technical Data |
| MC9S08LL36CLH | 功能描述:8位微控制器 -MCU S08 CPU, 36K FLASH, 64LQFP RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時(shí)鐘頻率:50 MHz 程序存儲(chǔ)器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。