E
參數(shù)資料
型號: MC9S08MM128VLH
廠商: Freescale Semiconductor
文件頁數(shù): 26/52頁
文件大?。?/td> 0K
描述: IC MCU 8BIT 128K FLASH 64LQFP
標準包裝: 160
系列: S08
核心處理器: S08
芯體尺寸: 8-位
速度: 48MHz
連通性: I²C,SCI,SPI,USB
外圍設(shè)備: LVD,POR,PWM,WDT
輸入/輸出數(shù): 33
程序存儲器容量: 128KB(128K x 8)
程序存儲器類型: 閃存
RAM 容量: 12K x 8
電壓 - 電源 (Vcc/Vdd): 1.8 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 6x16b,D/A 1x12b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 105°C
封裝/外殼: 64-LQFP
包裝: 托盤
Electrical Characteristics
Freescale Semiconductor
32
5
Full-Scale Error
16-bit differential mode
16-bit single-ended mode
EFS
+8/0
+12/0
+24/0
LSB2
TVADIN =
VDDA
13-bit differential mode
12-bit single-ended mode
0.7
2.0
2.5
T
11-bit differential mode
10-bit single-ended mode
0.4
1.0
T
9-bit differential mode
8-bit single-ended mode
0.2
0.5
T
6
Quantization
Error
16-bit modes
EQ
–1 to 0
LSB2
D
<13-bit modes
0.5
7
Effective
Number of Bits
16-bit differential mode
Avg=32
Avg=16
Avg=8
Avg=4
Avg=1
ENO
B14.3
13.8
13.4
13.1
12.4
14.5
14.0
13.7
13.4
12.6
Bits
C
Fin =
Fsample/10
0
8
Signal to Noise
plus Distortion
See ENOB
SINA
D
dB
9
Total Harmonic
Distortion
16-bit differential mode
Avg=32
THD
–95.8
–90.4
dB
CFin =
Fsample/10
0
16-bit single-ended mode
Avg=32
D
10
Spurious Free
Dynamic
Range
16-bit differential mode
Avg=32
SFDR
91.0
96.5
dB
C
Fin =
Fsample/10
0
16-bit single-ended mode
Avg=32
D
11
Input Leakage
Error
all modes
EIL
IIn * RAS
mV
D
IIn =
leakage
current
(refer to
DC
characteri
stics)
1 All accuracy numbers assume the ADC is calibrated with V
REFH=VDDA
2 Typical values assume V
DDA = 3.0V, Temp = 25C, fADCK=2.0MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
3 1 LSB = (V
REFH – VREFL)/2
N
Table 17. 16-bit SAR ADC Characteristics full operating range
(VREFH = VDDA, 2.7 V, VREFL = VSSA, fADACK 4 MHz, ADHSC = 1) (Continued)
#
Characteristic
Conditions1
Symb
Min
Typ2
Max
Unit
C
Comment
SINAD
6.02 ENOB
1.76
+
=
Freescale reserves the right to change the detail specifications as may be required to permit improvements in the design of its products.
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