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MCF52235 ColdFire Microcontroller, Rev. 3
Preliminary Electrical Characteristics
Freescale Semiconductor
Crystal start-up time
5, 6
t
cst
—
10
ms
EXTAL input high voltage
Crystal reference
External reference
V
IHEXT
V
DD
- 1.0
2.0
V
DD
V
DD
V
EXTAL input low voltage
Crystal reference
External reference
V
ILEXT
V
SS
V
SS
1.0
0.8
V
XTAL output high voltage
OH
= 1.0 mA
XTAL output low voltage
I
OL
= 1.0 mA
XTAL load capacitance
7
PLL lock time
5,9
Power-up to lock time
5, 7,8
With crystal reference
Without crystal reference
Duty cycle of reference
5
V
OL
V
DD
–1.0
—
V
V
OL
—
0.5
V
—
—
pF
t
lpll
t
lplk
—
500
μ
s
—
—
10.5
500
ms
μ
s
t
dc
f
UL
fLCK
40
60
% f
sys
% f
sys
% f
sys
Frequency un-LOCK range
–1.5
1.5
Frequency LOCK range
CLKOUT period Jitter
5, 6, 8, 9,10
, measured at f
SYS
Max
Peak-to-peak jitter (clock edge to clock edge)
Long term jitter (averaged over 2 ms interval)
–0.75
0.75
C
jitter
—
—
10
.01
% f
sys
1
Input to the PLL is limited to 10 MHz max; however, the PLL divider can accept up to 40 MHz. The input must be
divided down to a frequency no greater than 10 MHz. This is controlled by register CCHR.
2
All internal registers retain data at 0 Hz.
3
Loss of reference frequency is the reference frequency detected internally that transitions the PLL into self-clocked
mode.
4
Self-clocked mode frequency is the frequency that the PLL operates at when the reference frequency falls below f
LOR
with default MFD/RFD settings.
5
This parameter is characterized before qualification rather than 100% tested.
6
Proper PC board layout procedures must be followed to achieve specifications.
7
Load capacitance determined from crystal manufacturer specifications and include circuit board parasitics.
8
Assuming a reference is available at power up, lock time is measured from the time V
DD
and V
DDPLL
are valid to RSTO
negating. If the crystal oscillator is the reference for the PLL, the crystal start up time must be added to the PLL lock
time to determine the total start-up time.
9
Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
sys
.
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal.
Noise injected into the PLL circuitry via V
DDPLL
and V
SSPLL
and variation in crystal oscillator frequency increase the
C
jitter
percentage for a given interval
10
Based on slow system clock of 40 MHz measured at f
sys
max.
Table 25. PLL Electrical Specifications (continued)
(V
DD
and V
DDPLL
= 2.7 to 3.6 V, V
SS
= V
SSPLL
= 0 V)
Characteristic
Symbol
Min
Max
Unit