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參數(shù)資料
| 型號： | MCZ33797EK |
| 廠商： | 飛思卡爾半導體(中國)有限公司 |
| 英文描述： | Four Channel Squib Driver IC |
| 中文描述： | 四通道爆管驅動IC |
| 文件頁數(shù)： | 30/34頁 |
| 文件大?。?/td> | 290K |
| 代理商： | MCZ33797EK |
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Analog Integrated Circuit Device Data
Freescale Semiconductor
30
33797
FUNCTIONAL DEVICE OPERATION
PROTECTION AND DIAGNOSIS FEATURES
FET DRIVER CURRENT LIMIT
A single resistor is used to set the current limit protection
of the high-side drivers of both squib channels. The low-side
current limit is never less than the high-side current limit.
Example of current limit conditions:
R
R_LIMIT_X
= 10 k
, I
HS
= A ±
A
The high-side driver controls the current through the squib.
The current limit for the low-side driver is only to protect the
low-side driver stage from excessive current in the event of a
short to battery.
With R
R_LIMIT_X
conditions < 4.32
k
or shorted to ground,
the current limit will default to the
R
R_LIMIT_X = 10
k
current
limit, not to exceed. With R
R_LIMIT_X
resistance value > 60
k
or open, the current limit will default to the
R
R_LIMIT_X = 10
k
maximum current limit.
FET DRIVER CURRENT LIMIT MEASUREMENT
($7X COMMAND)
This function measures the firing current in each squib line
and records the “ON” time in which the I
MEAS
is above the
threshold for each squib. (Refer to Dynamic Electrical
Characteristics table, page
13
.) The timing registers can be
reset via SPI command so additional current measurements
can be made.
An 8-bit message will be used to determine 255 time
steps. The driver current limit measurement is activated when
each individual high-side driver is activated. Each time the
squib current is measured above the I
MEAS
threshold during
the timer activation, a status bit will be set to “1”. If the current
measured is not above the I
MEAS
threshold during the timer
activation, the timing data log bit will not increment. Each
squib timing register can be reset via SPI command so
additional current measurements can be made. Initial squib
IC power-up will reset the timing registers (i.e., “Power-ON
Reset”). When reset, the current limit measurement register
byte will be set to $00.
Command $79 will indicate the status of the current limit
measurement comparator. The current limit measurement
from the test is captured and loaded into the register on the
next valid SPI command. When the firing current is above
I
MEAS
, the current limit is activated and the status bit will be
set to “1”. If the firing current is below I
MEAS
, the current limit
status bit will be set to “0”.
FET DRIVER CURRENT LIMIT MEASUREMENT
RESET COMMAND ($3X COMMAND)
The current limit status registers can be individually reset
with the command set found in
Table 8
. When the register bit
is set to “1” for squib X, the current measurement register will
be reset to $00.
SQUIB DRIVER THERMAL SHUTDOWN
($7F COMMAND)
With a nominal squib load, the FET squib driver will
not
enter thermal shutdown until the driver has been active for a
minimum of 2.09 ms. The individual squib driver thermal
shutdown will not affect other squib drivers firing “ON” times.
With a shorted squib load, the FET squib driver will
not
enter thermal shutdown until the driver has been active for a
minimum of 2.090 ms. For the shorted squib load, the
associated FET squib driver
may
enter thermal shutdown
with an “ON” time of 2.09 ms
≤
t
ON
≤
2.82 ms.
When the thermal shutdown limit is exceeded, the thermal
status will be set to “1”. The thermal shutdown status ($7F)
diagnostics latch the thermal bit status when executed. The
Squib Driver Thermal shutdown status latch will be cleared
after the information is transmitted on the next valid SPI
command (i.e., TX: NOP or next $7F, latch cleared on rising
edge of chip select).
The FET squib driver can be activated through the arm ire
command when the TEMP
RENABLE
(MIN) is reached (thermal
shutdown status “0”).
V
TRANTSTX,
HIGH- AND LOW-SIDE SQUIB DRIVER
FET TEST and STATUS ($82 TO $83 COMMAND)
This function checks the squib driver FET transistor status.
The high- and low-side squib driver FET test requires
FEN_1 and FEN_2 pins to be low and two separate 8-bit write
commands to be made to the shift register. With the FEN_1
and FEN_2 pins status LOW, the first write is to unlock in
preparation of receiving the diagnostic command for testing
the high- and low-side squib drivers. The unlock command
($82 and $83) is an “AND” function with the FEN_1 and
FEN_2 BAR. All transistor test unlock commands ($82 and
$83) will be echoed back on the SPI Data output.
The high- or low-side squib driver FET test will be aborted
if firing from any FET is enabled.
During the first write (unlock command), all diagnostic
functions are cleared. After the second write is completed, all
other diagnostic functions are made available again.
Squib
1A, squib
1B, squib 2A, and squib 2B high-side
squib drivers will be activated and diagnosed by the $82
followed by $1X diagnostic command (refer to
Table 8
,
page
25
). A load from the SQB_HI_XX pin to the SENSE_XX
pin is required for the high-side squib driver to be tested.
Squib
1A, squib
1B, squib 2A, and squib 2B low-side
squib drivers will be activated and diagnosed by the $83
followed by $2X diagnostic command (
Table 8
).
When enabled the high- or low-side FET driver will be
enabled and current limited to a nominal current limit of
10 mA. The high- and low-side driver test time is not
automated and is controlled through SPI.
Table 9. R
R_LIMIT_X
Current Limit
R
R_LIMIT_X
V
VFIRE
= 7.0 V
V
VFIRE
= 35 V
4.32
k
0.92 A
0.92 A
10
k
1.37 A
1.37 A
45.3
k
2.0 A
2.0 A
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