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參數(shù)資料
| 型號： | MDC5000T1 |
| 廠商： | MOTOROLA INC |
| 元件分類： | 通信及網(wǎng)絡(luò) |
| 英文描述： | SILICON SMALLBLOCK INTEGRATED CIRCUIT |
| 中文描述： | SPECIALTY TELECOM CIRCUIT, PDSO4 |
| 封裝： | SOT-143, 4 PIN |
| 文件頁數(shù)： | 6/10頁 |
| 文件大?。?/td> | 215K |
| 代理商： | MDC5000T1 |
6
Motorola Small–Signal Transistors, FETs and Diodes Device Data
OPEN LOOP TEST CIRCUITS
Figure 8. ICC versus VCC Test Circuit
NOTE: VBE3 is used to simulate actual operating conditions
that reduce VCE2 & HFE2, and increase IB2 & Vref.
MDC5000T1
Vref (4)
VCC (3)
Iout (2)
GND (1)
VCC
Q1
Q2
ICC
+
Figure 9. Vref versus VCC Test Circuit
MDC5000T1
Vref (4)
VCC (3)
Iout (2)
GND (1)
VCC
Q1
Q2
Iout
Iout
+
VBE3 = 0.7 V
V
A
+
Vref
Iref
Figure 10. Vref versus TJ Test Circuit
MDC5000T1
Vref (4)
VCC (3)
Iout (2)
GND (1)
VCC =
2.75 V
Q1
Q2
Iout
Iout
+
VBE3 = 0.7 V
V
A
Vref
Iref
Figure 11. HFE versus Iout Test Circuit
MDC5000T1
Vref (4)
VCC (3)
Iout (2)
GND (1)
Q1
Q2
Iout
Iout
1.5 V
A
+
IB
NOTE: VBE3 is used to simulate actual operating conditions
that reduce VCE2 & HFE2, and increase IB2 & Vref.
+
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