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| 型號： | MPC8265AVVPJDC |
| 廠商： | Freescale Semiconductor |
| 文件頁數(shù)： | 15/50頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC MPU POWERQUICC II 480-TBGA |
| 標準包裝： | 21 |
| 系列： | MPC82xx |
| 處理器類型： | 32-位 MPC82xx PowerQUICC II |
| 速度： | 300MHz |
| 電壓： | 2V |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 480-LBGA |
| 供應(yīng)商設(shè)備封裝： | 408-TBGA（37.5x37.5） |
| 包裝： | 托盤 |
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MPC8260A PowerQUICC II Integrated Communications Processor Hardware Specifications, Rev. 2.0
22
Freescale Semiconductor
Electrical and Thermal Characteristics
Table 12 lists the JTAG timings.
NOTE
The UPM machine outputs change on the internal tick determined by the
memory controller programming; the AC specifications are relative to the
internal tick. Note that SDRAM and GPCM machine outputs change on
CLKin’s rising edge.
Table 12. JTAG Timings1
Parameter
Symbol2
Min
Max
Unit
Notes
JTAG external clock frequency of operation
fJTG
025
MHz
—
JTAG external clock cycle time
tJTG
40
—
ns
—
JTAG external clock pulse width measured at 1.4V
tJTKHKL
20
—
ns
—
JTAG external clock rise and fall times
tJTGR and
tJTGF
05
ns
6
TRST assert time
tTRST
25
—
ns
3, 6
Input setup times
Boundary-scan data
TMS, TDI
tJTDVKH
tJTIVKH
4
—
ns
4, 7
Input hold times
Boundary-scan data
TMS, TDI
tJTDXKH
tJTIXKH
10
—
ns
4, 7
Output valid times
Boundary-scan data
TDO
tJTKLDV
tJTKLOV
—
25
ns
5, 7
5. 7
Output hold times
Boundary-scan data
TDO
tJTKLDX
tJTKLOX
1
—
ns
5, 7
JTAG external clock to output high impedance
Boundary-scan data
TDO
tJTKLDZ
tJTKLOZ
1
25
ns
5, 6
1 All outputs are measured from the midpoint voltage of the falling/rising edge of t
TCLK to the midpoint of the signal
in question. The output timings are measured at the pins. All output timings assume a purely resistive 50-
Ω load.
Time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2 The symbols used for timing specifications herein follow the pattern of t
(first two letters of functional block)(signal)(state)
(reference)(state) for inputs and t((first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example,
tJTDVKH symbolizes JTAG device timing (JT) with respect to the time data input signals (D) reaching the valid state
(V) relative to the tJTG clock reference (K) going to the high (H) state or setup time. Also, tJTDXKH symbolizes JTAG
timing (JT) with respect to the time data input signals (D) went invalid (X) relative to the tJTG clock reference (K)
going to the high (H) state. Note that, in general, the clock reference symbol representation is based on three letters
representing the clock of a particular functional. For rise and fall times, the latter convention is used with the
appropriate letter: R (rise) or F (fall).
3 TRST is an asynchronous level sensitive signal. The setup time is for test purposes only.
4 Non-JTAG signal input timing with respect to t
TCLK.
5 Non-JTAG signal output timing with respect to t
TCLK.
6 Guaranteed by design.
7 Guaranteed by design and device characterization.
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