參數(shù)資料
型號: MPC8314EVRAGDA
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: MICROPROCESSOR, PBGA620
封裝: 29 X 29 MM, LEAD FREE, PLASTIC, TEPBGA-620
文件頁數(shù): 39/106頁
文件大?。?/td> 1253K
代理商: MPC8314EVRAGDA
MPC8314E PowerQUICC II Pro Processor Hardware Specifications, Rev. 0
38
Freescale Semiconductor
USB
10.1.1
USB DC Electrical Characteristics
Table 39 lists the DC electrical characteristics for the USB interface.
10.1.2
USB AC Electrical Specifications
Table 40 lists the general timing parameters of the USB-ULPI interface.
Figure 21 and Figure 22 provide the AC test load and signals for the USB, respectively.
Figure 21. USB AC Test Load
Table 39. USB DC Electrical Characteristics
Parameter
Symbol
Min
Max
Unit
High-level input voltage
VIH
2
LVDD + 0.3
V
Low-level input voltage
VIL
–0.3
0.8
V
Input current
IIN
—±5
μA
High-level output voltage, IOH = –100 μAVOH
LVDD – 0.2
V
Low-level output voltage, IOL = 100 μAVOL
—0.2
V
Note:
1. The symbol VIN, in this case, represents the NVIN symbol referenced in Table 1 and Table 2.
Table 40. USB General Timing Parameters
Parameter
Symbol 1
Min
Max
Unit
Notes
USB clock cycle time
tUSCK
15
ns
1, 2
Input setup to USB clock—all inputs
tUSIVKH
4—
ns
1, 4
Input hold to USB clock—all inputs
tUSIXKH
1—
ns
1, 4
USB clock to output valid—all outputs
tUSKHOV
—9
ns
1
Output hold from USB clock—all outputs
tUSKHOX
1—
ns
1
Notes:
1. The symbols used for timing specifications follow the pattern of t(First two letters of functional block)(signal)(state)(reference)(state) for
inputs and t(First two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tUSIXKH symbolizes USB timing
(US) for the input (I) to go invalid (X) with respect to the time the USB clock reference (K) goes high (H). Also, tUSKHOX
symbolizes USB timing (US) for the us clock reference (K) to go high (H), with respect to the output (O) going invalid (X) or
output hold time.
2. All timings are in reference to USB clock.
3. All signals are measured from NVDD/2 of the rising edge of USB clock to 0.4
× NVDD of the signal in question for 3.3-V
signaling levels.
4. Input timings are measured at the pin.
5. For purposes of active/float timing measurements, the Hi-Z or off-state is defined to be when the total current delivered
through the component pin is less than or equal to the leakage current specification.
Output
Z0 = 50 Ω
NVDD/2
RL = 50 Ω
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