參數(shù)資料
型號: MPC8544EAVTALF
廠商: Freescale Semiconductor
文件頁數(shù): 87/117頁
文件大小: 0K
描述: IC MPU POWERQUICC III 783-FCBGA
產(chǎn)品培訓(xùn)模塊: MPC8544E PowerQUICC™ III
標(biāo)準包裝: 1
系列: MPC85xx
處理器類型: 32-位 MPC85xx PowerQUICC III
速度: 667MHz
電壓: 0.95 V ~ 1.05 V
安裝類型: 表面貼裝
封裝/外殼: 783-BBGA,F(xiàn)CBGA
供應(yīng)商設(shè)備封裝: 783-FCPBGA(29x29)
包裝: 托盤
配用: MPC8544DS-ND - BOARD DEVELOPMENT SYSTEM 8544
MPC8544E PowerQUICC III Integrated Processor Hardware Specifications, Rev. 6
Freescale Semiconductor
71
High-Speed Serial Interfaces (HSSI)
16.2.4
AC Requirements for SerDes Reference Clocks
The clock driver selected should provide a high quality reference clock with low phase noise and
cycle-to-cycle jitter. Phase noise less than 100 kHz can be tracked by the PLL and data recovery loops and
is less of a problem. Phase noise above 15 MHz is filtered by the PLL. The most problematic phase noise
occurs in the 1–15 MHz range. The source impedance of the clock driver should be 50
Ωto match the
transmission line and reduce reflections which are a source of noise to the system.
Table 57 describes some AC parameters common to SGMII, and PCI Express protocols.
Figure 53. Differential Measurement Points for Rise and Fall Time
Table 57. SerDes Reference Clock Common AC Parameters
Parameter
Symbol
Min
Max
Unit
Notes
Rising Edge Rate
Rise Edge Rate
1.0
4.0
V/ns
2, 3
Falling Edge Rate
Fall Edge Rate
1.0
4.0
V/ns
2, 3
Differential Input High Voltage
VIH
+200
mV
2
Differential Input Low Voltage
VIL
–200
mV
2
Rising edge rate (SDn_REF_CLK) to falling edge rate
(SDn_REF_CLK) matching
Rise-Fall Matching
20
%
1, 4
Notes:
1. Measurement taken from single ended waveform.
2. Measurement taken from differential waveform.
3. Measured from –200 mV to +200 mV on the differential waveform (derived from SDn_REF_CLK minus SDn_REF_CLK). The
signal must be monotonic through the measurement region for rise and fall time. The 400 mV measurement window is
centered on the differential zero crossing. See Figure 53.
4. Matching applies to rising edge rate for SDn_REF_CLK and falling edge rate for SDn_REF_CLK. It is measured using a
200 mV window centered on the median cross point where SDn_REF_CLK rising meets SDn_REF_CLK falling. The median
cross point is used to calculate the voltage thresholds the oscilloscope is to use for the edge rate calculations. The rise edge
rate of SDn_REF_CLK should be compared to the fall edge rate of SDn_REF_CLK, the maximum allowed difference should
not exceed 20% of the slowest edge rate. See Figure 54.
VIH = +200 mV
VIL = –200 mV
0.0 V
SDn_REF_CLK
minus
SDn_REF_CLK
Fall Edge Rate
Rise Edge Rage
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