參數(shù)資料
型號: MPC8548ECPXAUJB
廠商: Freescale Semiconductor
文件頁數(shù): 40/151頁
文件大?。?/td> 0K
描述: MPU POWERQUICC III 783-PBGA
產(chǎn)品培訓(xùn)模塊: MPC8548 PowerQUICC III Processors
標(biāo)準(zhǔn)包裝: 1
系列: MPC85xx
處理器類型: 32-位 MPC85xx PowerQUICC III
速度: 1.333GHz
電壓: 1.1V
安裝類型: 表面貼裝
封裝/外殼: 783-BBGA,F(xiàn)CBGA
供應(yīng)商設(shè)備封裝: 783-FCPBGA(29x29)
包裝: 托盤
MPC8548E PowerQUICC III Integrated Processor Hardware Specifications, Rev. 9
134
Freescale Semiconductor
Thermal
21 Thermal
This section describes the thermal specifications of the device.
21.1
Thermal for Version 2.0 Silicon HiCTE FC-CBGA with Full Lid
This section describes the thermal specifications for the HiCTE FC-CBGA package for revision 2.0
silicon.
This table shows the package thermal characteristics.
21.2
Thermal for Version 2.1.1, 2.1.2, and 2.1.3 Silicon FC-PBGA with
Full Lid and Version 3.1.x Silicon with Stamped Lid
This section describes the thermal specifications for the FC-PBGA package for revision 2.1.1, 2.1.2, and
3.0 silicon.
This table shows the package thermal characteristics.
Table 84. Package Thermal Characteristics for HiCTE FC-CBGA
Characteristic
JEDEC Board
Symbol
Value
Unit
Notes
Die junction-to-ambient (natural convection)
Single-layer board (1s)
RJA
17
°C/W
1, 2
Die junction-to-ambient (natural convection)
Four-layer board (2s2p)
RJA
12
°C/W
1, 2
Die junction-to-ambient (200 ft/min)
Single-layer board (1s)
RJA
11
°C/W
1, 2
Die junction-to-ambient (200 ft/min)
Four-layer board (2s2p)
RJA
8°C/W
1, 2
Die junction-to-board
N/A
RJB
3°C/W3
Die junction-to-case
N/A
RJC
0.8
°C/W
4
Notes:
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board)
temperature, ambient temperature, airflow, power dissipation of other components on the board, and board thermal
resistance.
2. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.
3. Thermal resistance between the die and the printed-circuit board per JEDEC JESD51-8. Board temperature is measured on
the top surface of the board near the package.
4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method
1012.1). The cold plate temperature is used for the case temperature, measured value includes the thermal resistance of the
interface layer.
Table 85. Package Thermal Characteristics for FC-PBGA
Characteristic
JEDEC Board
Symbol
Value
Unit
Notes
Die junction-to-ambient (natural convection)
Single-layer board (1s)
RJA
18
°C/W
1, 2
Die junction-to-ambient (natural convection)
Four-layer board (2s2p)
RJA
13
°C/W
1, 2
Die junction-to-ambient (200 ft/min)
Single-layer board (1s)
RJA
13
°C/W
1, 2
Die junction-to-ambient (200 ft/min)
Four-layer board (2s2p)
RJA
9°C/W
1, 2
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