參數(shù)資料
型號： MSP430F2617TPN
廠商： TEXAS INSTRUMENTS INC
元件分類： 微控制器/微處理器
英文描述： 16-BIT, FLASH, 16 MHz, RISC MICROCONTROLLER, PQFP80
封裝： GREEN, PLASTIC, LQFP-80
文件頁數(shù)： 31/102頁
文件大?。?/td> 1509K
代理商： MSP430F2617TPN
MSP430F261x
MSP430F241x
SLAS541H
– JUNE 2007 – REVISED MAY 2011
Schmitt-Trigger Inputs (Ports P1 Through P8, RST/NMI, JTAG, XIN, and XT2IN)
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP
MAX
UNIT
0.45 VCC
0.75 VCC
VIT+
Positive-going input threshold voltage
2.2 V
1.00
1.65
V
3 V
1.35
2.25
0.25 VCC
0.55 VCC
VIT-
Negative-going input threshold voltage
2.2 V
0.55
1.20
V
3 V
0.75
1.65
2.2 V
0.2
1
Vhys
Input voltage hysteresis (VIT+ - VIT-)
V
3 V
0.3
1
For pullup: VIN = VSS,
RPull
Pullup/pulldown resistor
20
35
50
k
Ω
For pulldown: VIN = VCC
CI
Input capacitance
VIN = VSS or VCC
5
pF
(1)
XIN and XT2IN in bypass mode only
Inputs (Ports P1 and P2)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
MAX
UNIT
Port P1, P2: P1.x to P2.x, External trigger pulse width to set
t(int)
External interrupt timing
2.2 V/3 V
20
ns
interrupt flag(1)
(1)
An external signal sets the interrupt flag every time the minimum interrupt pulse width t(int) is met. It may be set even with trigger signals
shorter than t(int).
Leakage Current (Ports P1 Through P8)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
MAX
UNIT
Ilkg(Px.y)
High-impedance leakage current
(1) (2)
2.2 V/3 V
±50
nA
(1)
The leakage current is measured with VSS or VCC applied to the corresponding pin(s), unless otherwise noted.
(2)
The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is
disabled.
Standard Inputs (RST/NMI)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
MAX
UNIT
VIL
Low-level input voltage
2.2 V/3 V
VSS
VSS + 0.6
V
VIH
High-level input voltage
2.2 V/3 V
0.8 VCC
VCC
V
34
Copyright
2007–2011, Texas Instruments Incorporated
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