參數(shù)資料
型號: PCF51JM64EVLK
廠商: Freescale Semiconductor
文件頁數(shù): 7/49頁
文件大?。?/td> 0K
描述: MCU 32BIT 64K FLASH 80-LQFP
標準包裝: 90
系列: MCF51JM
核心處理器: Coldfire V1
芯體尺寸: 32-位
速度: 50MHz
連通性: CAN,I²C,SCI,SPI,USB OTG
外圍設備: LVD,PWM,WDT
輸入/輸出數(shù): 66
程序存儲器容量: 64KB(64K x 8)
程序存儲器類型: 閃存
RAM 容量: 16K x 8
電壓 - 電源 (Vcc/Vdd): 2.7 V ~ 5.5 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 12x12b
振蕩器型: 外部
工作溫度: -40°C ~ 105°C
封裝/外殼: 80-LQFP
包裝: 托盤
Preliminary Electrical Characteristics
MCF51JM128 ColdFire Microcontroller, Rev. 4
Freescale Semiconductor
15
2
Preliminary Electrical Characteristics
This section contains electrical specification tables and reference timing diagrams for the MCF51JM128 microcontroller,
including detailed information on power considerations, DC/AC electrical characteristics, and AC timing specifications.
The electrical specifications are preliminary and are from previous designs or design simulations. These specifications may not
be fully tested or guaranteed at this early stage of the product life cycle. These specifications will, however, be met for
production silicon. Finalized specifications will be published after complete characterization and device qualifications have
been completed.
NOTE
The parameters specified in this data sheet supersede any values found in the module
specifications.
2.1
Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
NOTE
The classification is shown in the column labeled C in the parameter tables where
appropriate.
2.2
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table 6 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields; however, it is advised
that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this
high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for
instance, VSS or VDD).
Table 5. Parameter Classifications
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a
statistically relevant sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from
typical devices under typical conditions unless otherwise noted. All values shown in the
typical column are within this category.
D
Those parameters are derived mainly from simulations.
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