參數(shù)資料
型號(hào): PIC10F222-E/OT
廠商: Microchip Technology
文件頁數(shù): 59/86頁
文件大?。?/td> 0K
描述: IC PIC MCU FLASH 512X12 SOT-23-6
標(biāo)準(zhǔn)包裝: 3,000
系列: PIC® 10F
核心處理器: PIC
芯體尺寸: 8-位
速度: 8MHz
外圍設(shè)備: POR,WDT
輸入/輸出數(shù): 4
程序存儲(chǔ)器容量: 768B(512 x 12)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 23 x 8
電壓 - 電源 (Vcc/Vdd): 2 V ~ 5.5 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 2x8b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 125°C
封裝/外殼: SOT-23-6
包裝: 散裝
PIC10F220/222
DS41270E-page 60
2007 Microchip Technology Inc.
TABLE 10-5:
A/D CONVERTER CHARACTERISTICS
TABLE 10-6:
A/D CONVERSION REQUIREMENTS
Standard Operating Conditions (unless otherwise stated)
Operating temperature
-40°C
≤ TA ≤ +125°C
Param
No.
Sym
Characteristic
Min
Typ
Max
Units
Conditions
A01
NR
Resolution
8 bits
bit
A03
EIL
Integral Error
±1.5
LSb
A04
EDL
Differential Error
-1 < EDL
≤ + 1.5
LSb
A05
EFS
Full-scale Range
2.0*
5.5*
V
A06
EOFF
Offset Error
±1.5
LSb
A07
EGN
Gain Error
±1.5
LSb
A10
Monotonicity
guaranteed(1)
——
VSS
≤ VAIN ≤ VDD
A25
VAIN
Analog Input Voltage
VSS
—VDD
V
A30
ZAIN
Recommended
Impedence of Analog
Voltage Source
——
10
k
Ω
A31*
ΔIAD
A/D Conversion Current(2)
120
150
μA2.0V
200
250
μA5.0V
*
These parameters are characterized but not tested.
Data in the “Typ” column is at 5.0V, 25°C unless otherwise stated. These parameters are for design
guidance only are not tested.
Note 1:
The A/D conversion result never decreases with an increase in the input voltage and has no missing
codes.
2:
This is the additional current consumed by the A/D module when it is enabled; this current adds to base
IDD.
Standard Operating Conditions (unless otherwise stated)
Operating temperature
-40°C
≤ TA ≤ +125°C
Param
No.
Sym
Characteristic
Min
Typ
Max
Units
Conditions
AD131
TCNV
Conversion Time
(not including
Acquisition Time)
—13
TCY
Set GO/DONE bit to new data in A/D
Result register
AD132* TACQ
Acquisition Time(1)
—3.5
5
μs
VDD = 5V
VDD = 2.5V
*
These parameters are characterized but not tested.
Data in ‘Typ’ column is at 5.0V, 25°C unless otherwise stated. These parameters are for design guidance
only and are not tested.
Note 1:
The Section 7.9 “A/D Acquisition Requirements” for information on how to compute minimum
acquisition times based on operating conditions.
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