參數(shù)資料
型號(hào): PIC12F519-I/MS
廠商: Microchip Technology
文件頁數(shù): 63/96頁
文件大?。?/td> 0K
描述: IC PIC MCU FLASH 1KX12 8MSOP
產(chǎn)品培訓(xùn)模塊: Asynchronous Stimulus
8-bit PIC® Microcontroller Portfolio
標(biāo)準(zhǔn)包裝: 100
系列: PIC® 12F
核心處理器: PIC
芯體尺寸: 8-位
速度: 8MHz
外圍設(shè)備: POR,WDT
輸入/輸出數(shù): 5
程序存儲(chǔ)器容量: 1.5KB(1K x 12)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 41 x 8
電壓 - 電源 (Vcc/Vdd): 2 V ~ 5.5 V
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 8-TSSOP,8-MSOP(0.118",3.00mm 寬)
包裝: 管件
產(chǎn)品目錄頁面: 637 (CN2011-ZH PDF)
配用: AC162096-ND - HEADER MPLAB ICD2 PIC16F526 8/14
AC164325-ND - MODULE SKT FOR 8MSOP
PIC12F519
DS41319B-page 64
2008 Microchip Technology Inc.
TABLE 11-2:
DC CHARACTERISTICS: PIC12F519 (Extended)
DC CHARACTERISTICS
Standard Operating Conditions (unless otherwise specified)
Operating Temperature -40
°C ≤ TA ≤ +125°C (extended)
Param
No.
Sym.
Characteristic
Min.
Typ(1)
Max.
Units
Conditions
D001
VDD
Supply Voltage
2.0
5.5
V
D002
VDR
RAM Data Retention Voltage(2)
1.5*
V
Device in Sleep mode
D003
VPOR VDD Start Voltage to ensure
Power-on Reset
—Vss
V
for details
D004
SVDD VDD Rise Rate to ensure
Power-on Reset
0.05*
for details
D005
IDDP
Supply Current
During Prog/
Erase.
—250*
μA
D010
IDD
Supply Current(3,4)
175
400
250
700
μA
mA
FOSC = 4 MHz, VDD = 2.0V
FOSC = 4 MHz, VDD = 5.0V
250
0.75
400
1.2
μA
mA
FOSC = 8 MHz, VDD = 2.0V
FOSC = 8 MHz, VDD = 5.0V
11
38
24
110
μA
FOSC = 32 kHz, VDD = 2.0V
FOSC = 32 kHz, VDD = 5.0V
D020
IPD
Power-down Current(5)
0.1
0.35
9.0
15.0
μA
VDD = 2.0V
VDD = 5.0V
D022
IWDT
WDT Current
1.0
7.0
18
22
μA
VDD = 2.0V
VDD = 5.0V
* These parameters are characterized but not tested.
Note 1:
Data in the Typical (“Typ”) column is based on characterization results at 25
°C. This data is for design
guidance only and is not tested.
2:
This is the limit to which VDD can be lowered in Sleep mode without losing RAM data.
3:
The supply current is mainly a function of the operating voltage and frequency. Other factors such as bus
loading, oscillator type, bus rate, internal code execution pattern and temperature also have an impact on
the current consumption.
4:
The test conditions for all IDD measurements in active operation mode are:
OSC1 = external square wave, from rail-to-rail for external clock modes; all I/O pins tri-stated, pulled to
VSS, T0CKI = VDD, MCLR = VDD; WDT enabled/disabled as specified.
5:
For standby current measurements, the conditions are the same as IDD, except that the device is in Sleep
mode. If a module current is listed, the current is for that specific module enabled and the device in Sleep.
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