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參數(shù)資料
| 型號(hào)： | PK40X256VMD100 |
| 廠商： | Freescale Semiconductor |
| 文件頁(yè)數(shù)： | 78/78頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC ARM CORTEX MCU 256K 144-MAP |
| 產(chǎn)品培訓(xùn)模塊： | Kinetis® Cortex-M4 Microcontroller Family |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | Kinetis |
| 核心處理器： | ARM? Cortex?-M4 |
| 芯體尺寸： | 32-位 |
| 速度： | 100MHz |
| 連通性： | CAN，EBI/EMI，I²C，IrDA，SDHC，SPI，UART/USART，USB，USB OTG |
| 外圍設(shè)備： | DMA，I²S，LCD，LVD，POR，PWM，WDT |
| 輸入/輸出數(shù)： | 98 |
| 程序存儲(chǔ)器容量： | 256KB（256K x 8） |
| 程序存儲(chǔ)器類型： | 閃存 |
| EEPROM 大?。?/td> | 4K x 8 |
| RAM 容量： | 64K x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 1.71 V ~ 3.6 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 33x16b，D/A 2x12b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 105°C |
| 封裝/外殼： | 144-LBGA |
| 包裝： | 托盤 |
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3.6 Relationship between ratings and operating requirements
–
- No permanent failure
- Correct operation
Normal operating range
Fatal range
Expected permanent failure
Fatal range
Expected permanent failure
Operating
rating
(max.)
Operating
requirement
(max.)
Operating
requirement
(min.)
Operating
rating
(min.)
Operating (power on)
Degraded operating range
–
No permanent failure
Handling range
Fatal range
Expected permanent failure
Fatal range
Expected permanent failure
Handling
rating
(max.)
Handling
rating
(min.)
Handling (power off)
- No permanent failure
- Possible decreased life
- Possible incorrect operation
- No permanent failure
- Possible decreased life
- Possible incorrect operation
3.7 Guidelines for ratings and operating requirements
Follow these guidelines for ratings and operating requirements:
Never exceed any of the chip’s ratings.
During normal operation, don’t exceed any of the chip’s operating requirements.
If you must exceed an operating requirement at times other than during normal
operation (for example, during power sequencing), limit the duration as much as
possible.
3.8 Definition: Typical value
A typical value is a specified value for a technical characteristic that:
Lies within the range of values specified by the operating behavior
Given the typical manufacturing process, is representative of that characteristic
during operation when you meet the typical-value conditions or other specified
conditions
Typical values are provided as design guidelines and are neither tested nor guaranteed.
Terminology and guidelines
K40 Sub-Family Data Sheet Data Sheet, Rev. 7, 02/2013.
Freescale Semiconductor, Inc.
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